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verified SJR 0,386 · Q2 • database Scopus / SJR & Web of Science indexed
Journal of Applied Remote Sensing
United States · SPIE
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Journal of Applied Remote Sensing

Journal of Applied Remote Sensing is a journal indexed in SJR in Earth and Planetary Sciences (miscellaneous) with an H index of 68. It has an SJR impact factor of 0,386 and it has a best quartile of Q2. It has an SJR impact factor of 0,386.

Publisher: SPIE
Category: Earth and Planetary Sciences (miscellaneous)
Indexation: verifiedScopus / SJR verifiedWeb of Science
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schedule CountryOfPapers database fields
SJR Impact Factor trending_up
0,386 Q2
H-index 68
Acceptance rate pie_chart
30% Selective
Source Acceptance_Rate
Time to publication hourglass_top
NPD
Field NPD
Publication cost (APC) payments
NPD Subscription
Non-OA path NPD

Metrics

Scimago and CountryOfPapers database fields

Scopus / SJR Web of Science

SJR Impact

0,386

H-index

68

Docs (year)

194

Docs 3y

635

Total refs

8896

Cites 3y

1185

Citable 3y

627

Cites/Doc 2y

1.72

Ref/Doc

45.86

Immediate OA

—

Embargoed OA

NPD

Non OA / Submission

—

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