verified SJR 0,165 · Q4 • database Scopus / SJR & Web of Science & DOAJ indexed

United States · Pleiades Publishing

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Journal of Surface Investigation

Journal of Surface Investigation is a journal indexed in SJR in Surfaces, Coatings and Films and Nanoscience and Nanotechnology with an H index of 27. It has an SJR impact factor of 0,165 and it has a best quartile of Q4. It is published in English. It has an SJR impact factor of 0,165.

ISSN: 1027-4510

Publisher: Pleiades Publishing

Category: Surfaces, Coatings and Films

Indexation: verifiedScopus / SJR verifiedWeb of Science verifiedDOAJ

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schedule CountryOfPapers database fields

SJR Impact Factor trending_up

0,165 Q4

H-index 27

Acceptance rate pie_chart

39%

Source Acceptance_Rate

Time to publication hourglass_top

NPD

Field NPD

Publication cost (APC) payments

NPD Subscription

Non-OA path NPD

Metrics

Scimago and CountryOfPapers database fields

Scopus / SJR Web of Science DOAJ

SJR Impact

0,165

H-index

Docs (year)

250

Docs 3y

743

Total refs

6668

Cites 3y

310

Citable 3y

743

Cites/Doc 2y

0.37

Ref/Doc

26.67

Immediate OA

—

Embargoed OA

NPD

Non OA / Submission

—

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Best articles by citations

Comparative analysis of sensory rhodopsin II structures in complex with a transducer and without it

X-ray spectra from deuterated crystal structures interacting with ion beams with energies below 25 keV

Effect of concentration substitution on the size factor in Li1 - x Na x NbO3 solid solutions

Distinctive features of the reflection spectra and radiation resistance of coatings based on ZnO powders modified by SiO2 nanoparticles

Determination of the local atomic structure of the active center of bromoperoxidase protein via the analysis of x-ray absorption spectra

Detection of growth striations in single crystals by digital processing of topographic images

Detection and investigation of undamped temperature waves excited under water jet cavitation

Dependence between the defocusing of the low-voltage SEM probe and its electron-density distribution

Deformation structuring of aluminum films upon microindentation

Control of electron-probe-system parameters using maps of the intensity distribution of the secondary-emission signal

Computer simulation of phase-contrast images in white synchrotron radiation using micropipes in silicon carbide

Comparison of the hardness of TiC/a-C coatings obtained by the method of the magnetron sputtering of a graphite target with high- and low-power pulses

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Comparative analysis of TXRF-spectroscopy efficiency under the testing target excitation by fluxes formed by the slit-cut system and waveguide-resonator

A neutron activation study of DNA-Gd nanocrystals

Coexistence of superconductivity and ferromagnetism in the Nb(500 u)/Fe(39 u)/[Si(34 u)/Mo(34 u)]40/Si nanostructure

Changes in the composition and optical properties of Cu and Cu2O nanofilms deposited on SiO2 substrates after annealing and bombardment by argon and hydrogen ions

Changes in the chemical composition of nuclear-reaction products irradiated with 10-MeV gamma quanta in deuterium-saturated palladium

Changes in K-208 glass transmittance spectra under ionizing radiation and molecular fluxes

Change in the optical properties of borosilicate glass under atom bombardment at grazing incidence angles

Calibration of the X-Ray spectroheliograph Mg XII for the 0.84 nm spectral line for the TESIS experiment

Bulk model of rapid thermal oxidation of silicon

beta-NMR and nuclear spin diffusion in a spatially disordered subsystem

Atomic-force microscopy of Fe3(SiAl) alloys under magnetic-pulse treatment

Asymmetric wave reflection in kinematic and dynamic approaches to description of parametric X-radiation of a relativistic electron in the crystal

FAQs

Journal of Surface Investigation has an SJR of 0,165 (best quartile Q4) in the CountryOfPapers database.

Immediate OA APC is not available (NPD).

The acceptance rate recorded for Journal of Surface Investigation is 39%.

Journal of Surface Investigation

Metrics

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Researcher reviews

Best articles by citations

FAQs

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