verified SJR 0,302 · Q3 • database Scopus / SJR & Web of Science indexed

Poland · Polish Academy of Sciences,...

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Metrology and Measuring Systems

Metrology and Measuring Systems is a journal indexed in SJR in Control and Systems Engineering and Instrumentation with an H index of 37. It has an SJR impact factor of 0,302 and it has a best quartile of Q3. It has an SJR impact factor of 0,302.

ISSN: 0860-8229

Publisher: Polish Academy of Sciences, Committee on Metrology and Scientific Instrumentation

Category: Control and Systems Engineering

Indexation: verifiedScopus / SJR verifiedWeb of Science

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schedule CountryOfPapers database fields

SJR Impact Factor trending_up

0,302 Q3

H-index 37

Acceptance rate pie_chart

35%

Source Acceptance_Rate

Time to publication hourglass_top

NPD

Field NPD

Publication cost (APC) payments

NPD Subscription

Non-OA path NPD

Metrics

Scimago and CountryOfPapers database fields

Scopus / SJR Web of Science

SJR Impact

0,302

H-index

Docs (year)

Docs 3y

150

Total refs

1129

Cites 3y

200

Citable 3y

149

Cites/Doc 2y

1.12

Ref/Doc

28.95

Immediate OA

—

Embargoed OA

NPD

Non OA / Submission

—

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Best articles by citations

A Reconstruction Method of Generalized Sampling Based on Generalized Inverse

What is the Role of the Stagnation Region in Karman Vortex Shedding?

Analyzing Variations in Roundness Profile Parameters During the Wavelet Decomposition Process Using the Matlab Environment

Analytical Synthesis of Parameter-Varying Filter of Constant Component with Application to Switching Systems

Analysis of the Factors Affecting the Realization of Lambda Transition Temperature of 4He

Analysis of Properties of a Lung Mechanical Model During Artificial Ventilation Using Measurement Station

Analog Circuit Fault Classification Using Improved One-Against-One Support Vector Machines

An Adaptive Synthesis Calibration Method for Time-Interleaved Sampling Systems

Alternative Automatic Vehicle Classification Method

Algorithms of Chemicals Detection Using Raman Spectra

Algorithmic Method for Phase Angle Shift of Noisy Voltages Using Conditional Averaging of Delayed Signal's Absolute Value

Advanced User Interface Generation in the Software Framework for Magnetic Measurements at Cern

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A New Method of Line Feature Generalization Based on Shape Characteristic Analysis

A New Method of Inductive Sensor Impedance Measurement Applied to the Identification of Vehicle Parameters

A New Elastic Scheduling Task Model in the Node of a Control and Measurement System

A New Diagnosing Method of the Internal Structure of the Titanium Fan of a Jet Engine with Laser Ultrasonics

A Method of RTS Noise Identification in Noise Signals of Semiconductor Devices in the Time Domain

A Fault Diagnosis Method for Substation Grounding Grid Based on the Square-Wave Frequency Domain Model

A Family of New Generation Miniaturized Impedance Analyzers for Technical Object Diagnostics

A Concept of a Passive Radar with Quadrature Microwave Phase Discriminators

FAQs

Metrology and Measuring Systems has an SJR of 0,302 (best quartile Q3) in the CountryOfPapers database.

Immediate OA APC is not available (NPD).

The acceptance rate recorded for Metrology and Measuring Systems is 35%.

Metrology and Measuring Systems

Metrics

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Researcher reviews

Best articles by citations

FAQs

What is the SJR of Metrology and Measuring Systems?

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What is the acceptance rate?