ISSN: 0860-8229

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Metrology and Measuring Systems Q3 Unclaimed

Polish Academy of Sciences, Committee on Metrology and Scientific Instrumentation Poland

Unfortunately this journal has not been claimed yet. For this reason, some information may be unavailable.

Metrology and Measuring Systems is a journal indexed in SJR in Control and Systems Engineering and Instrumentation with an H index of 37. It has an SJR impact factor of 0,302 and it has a best quartile of Q3. It has an SJR impact factor of 0,302.

Type: Journal

Type of Copyright:

Languages:

Open Access Policy:

Type of publications:

Publication frecuency: -

Categories: Control and Systems Engineering (Q3) Instrumentation (Q3)

Price

- €

Inmediate OA

NPD

Embargoed OA

- €

Non OA

Metrics

0,302

SJR Impact factor

37

H Index

39

Total Docs (Last Year)

150

Total Docs (3 years)

1129

Total Refs

200

Total Cites (3 years)

149

Citable Docs (3 years)

1.12

Cites/Doc (2 years)

28.95

Ref/Doc

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Aims and Scope

Best articles by citations

Fusion of Data from Inertial Sensors, Raster Maps and GPS for Estimation of Pedestrian Geographic Location in Urban Terrain

Standard Deviation of the Mean of Autocorrelated Observations Estimated with the Use of the Autocorrelation Function Estimated From the Data

Minimization of Maximum Errors in Universal Approximation of the Unit Circle by a Polygon

LCoS spatial light modulators as active phase elements of full-field measurement systems and sensors

Holistic Qualification in Manufacturing Metrology by Enhancing Knowledge Exchange Among Different User Groups

Jitter Measurement on the Basis of High-Precision Event Timer

A New Diagnosing Method of the Internal Structure of the Titanium Fan of a Jet Engine with Laser Ultrasonics

"Telemedical System ""Pulmotel-2010"" for Monitoring Patients with Chronic Pulmonary Diseases"

Measuring the Stray Capacitance of Solenoids with a Transmitting and a Receiving Coil

Surface Roughness Analysis in Milling of Tungsten Carbide with CBN Cutters

Metrological conditions of strain measurement optoelectronic method by the use of fibre bragg gratings

Optical Multi-Sensor Metrology for Extruded Profiles

SHOW MORE ARTICLES

METROLOGICAL PROPERTIES OF A/D CONVERTERS UTILIZING HIGHER ORDER SIGMA-DELTA MODULATORS COMPARED WITH A/D CONVERTERS WITH MODULATORS OF FIRST ORDER

The Choice Between Analog or Digital AC Power Measurement in a Vodafone Base Station Data Logger

Comparison of Tracking Methods in Respect of Automation of an Animal Behavioral Test

Measurement, Modeling and Evaluation of Surface Parameter Using Capacitive-Sensor-Based Measurement System

Infrared Imaging Fourier Transform Spectrometer as the Stand-Off Gas Detection System

The Quantum SI - Towards the New Systems of Units

ROTATION ERROR MODELING AND IDENTIFICATION FOR ROBOT KINEMATIC CALIBRATION BY CIRCLE POINT METHOD

What is the Role of the Stagnation Region in Karman Vortex Shedding?

Accuracy Assessment of Shape Mapping Using Computer Tomography

Fitting Spatial Models of Geometric Deviations of Free-Form Surfaces Determined in Coordinate Measurements

A New Method of Inductive Sensor Impedance Measurement Applied to the Identification of Vehicle Parameters

A New Method of Line Feature Generalization Based on Shape Characteristic Analysis