ISSN: 1063-7850

Journal Home

Journal Guideline

Technical Physics Letters Q3 Unclaimed

Pleiades Publishing United States

Unfortunately this journal has not been claimed yet. For this reason, some information may be unavailable.

Technical Physics Letters is a journal indexed in SJR in Physics and Astronomy (miscellaneous) with an H index of 41. It has an SJR impact factor of 0,215 and it has a best quartile of Q3. It is published in English. It has an SJR impact factor of 0,215.

Type: Journal

Type of Copyright:

Languages: English

Open Access Policy:

Type of publications:

Publication frecuency: -

Categories: Physics and Astronomy (miscellaneous) (Q3)

Price

- €

Inmediate OA

NPD

Embargoed OA

- €

Non OA

Metrics

0,215

SJR Impact factor

41

H Index

77

Total Docs (Last Year)

452

Total Docs (3 years)

1069

Total Refs

185

Total Cites (3 years)

452

Citable Docs (3 years)

0.38

Cites/Doc (2 years)

13.88

Ref/Doc

Comments

No comments ... Be the first to comment!

Publication speed *

Review quality *

Edition and editorial team *

Institutional email or ORCID *

* The email or ORCID field is only to validate the authenticity of the comment, the identity will not be public. .

Other journals with similar parameters

UPB Scientific Bulletin, Series A: Applied Mathematics and Physics Q3
Chelyabinsk Physical and Mathematical Journal Q3
Chemical Physics Letters: X Q3
Chinese Physics B Q3
Quantum Information and Computation Q3

Compare this journals

Aims and Scope

Best articles by citations

The phenomenon of decrease in the friction force upon transition to the superconducting state

The effect of annealing on the electroluminescence of SiO2 layers with excess silicon

Satellite peak splitting in the X-ray diffraction rocking curves of a crystal modulated by surface acoustic wave

Conductivity and dielectric properties of iron-containing nanocomposites

Refined parameters of the pair potential of interaction between nitrogen and water molecules

The electroluminescence of SiO2 layers with excess silicon

Tribospectroscopy of surfaces with statistically random roughness

Semiconductor-propolis heterojunction

The binding energy of molecules in thin fullerene films

Sensitivity of the thermocapillary method of thickness determination for transparent liquid films on horizontal absorbing substrates

The effect of phase modulation of scattered radiation on the asymptotic behavior of the contrast ratio of partially coherent speckle fields

The electron beam with virtual cathode in a two-section drift tube

SHOW MORE ARTICLES

On the role of exothermal chemical reaction during wire explosion in water

A multiplexer/demultiplexer for coarse wavelength-division multiplexing

Reconstructing nonautonomous system models with discrete spectrum of external action

Rotation of the magnetization vector of a monodomain particle under the action of a high-frequency field pulse

The effect of a space charge on the operation of a high-power semiconductor current interrupter

A magnetooptical study of the odd crystal field component in a terbium-yttrium aluminum garnet

Dependence of the transient process duration on the accuracy of determination in dynamical systems with quasiperiodic behavior

Additional relationship between canonical and microcanonical ensembles in classical statistical mechanics

Measuring hardness of brittle solids

A xenon-iodine electric discharge bactericidal lamp

Accelerated mechanical alloying of mutually insoluble metals: Co-Cu system

The main feature of the guide structures described by non-self-conjugate electrodynamic operators