verified SJR 0,411 · Q3 • database Scopus / SJR & Web of Science indexed

United Kingdom · John Wiley and Sons Ltd

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X-Ray Spectrometry

X-Ray Spectrometry is a journal indexed in SJR in Spectroscopy with an H index of 53. It has a price of 2583 €. It has an SJR impact factor of 0,411 and it has a best quartile of Q3. It is published in English. It has an SJR impact factor of 0,411.

ISSN: 0049-8246

Publisher: John Wiley and Sons Ltd

Category: Spectroscopy

Indexation: verifiedScopus / SJR verifiedWeb of Science

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schedule CountryOfPapers database fields

SJR Impact Factor trending_up

0,411 Q3

H-index 53

Acceptance rate pie_chart

31%

Source Acceptance_Rate

Time to publication hourglass_top

NPD

Field NPD

Publication cost (APC) payments

2.583 € Open Access

Non-OA path 0 €

Metrics

Scimago and CountryOfPapers database fields

Scopus / SJR Web of Science

SJR Impact

0,411

H-index

Docs (year)

Docs 3y

138

Total refs

1921

Cites 3y

203

Citable 3y

129

Cites/Doc 2y

1.34

Ref/Doc

30.98

Immediate OA

2583 €

Embargoed OA

NPD

Non OA / Submission

0 €

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Best articles by citations

Chemical shift and lineshape of high-resolution Ni Ka x-ray fluorescence spectra

X-Rays: The First Hundred Years Edited by ALAN MICHETTE and SLAWKA PFAUNTSCH. Wiley, New York, 1996, 262 pp.

Determination of the elemental composition of aortic valve cusps by EDXRF

Determination of the distribution of elements in a low-Z matrix with the use of microbeam x-ray fluorescence spectrometry

Determination of the carbon content in coal and ash by XRF

Determination of some rare earth elements by EDXRF and artificial neural networks

Determination of major and minor ions in brines by x-ray fluorescence spectrometry: comparison with other common analytical methods

Determination of light elements using x-ray spectrometry. Part I - Analytical implications of using scattered tube lines

Correlation between element concentrations and x-ray diffraction patterns in hair

Corrections to the conventional approach to Si(Li) detector efficiency

Concentrations of some elements in and on Scots pine needles

Comparison of the detection limits in the analysis of some medium atomic number elements measured with a portable XRF and an external proton beam PIXE spectrometer system

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Choice Between the Use of Experimental and Theoretical Values of L Subshell X-Ray Fluorescence Cross-Sections for Various Applications

A correction procedure for the self-absorption artifacts in x-ray Compton tomography

Chemical determination of coloured zoned minerals in'natural stones' by EDS/WDS electron microprobe: an example from dumortierite quartzites

AXIS: Automated XRF Interpretation of Spectra

Atomic excitation and ionization as the result of inner-shell vacancy creation

Assessing scattering effects in annular radioisotope excited XRF

Applications of Glancing Incidence X-Ray Analysis

Application of the TXRF method to the elemental analysis of cerebrospinal fluid in amyotrophic lateral sclerosis

Analysis of silicates using wavelength-dispersive x-ray fluorescence spectrometry for major elements: effects of loss elimination and catch-weights

An x-ray guide tube and a desk-top scanning x-ray analytical microscope

An algorithm combining neural networks with fundamental parameters

Accumulation of elements in the annual rings of Scots pine trees in the vicinity of a copper-nickel smelter measured by scanning EDXRF

FAQs

X-Ray Spectrometry has an SJR of 0,411 (best quartile Q3) in the CountryOfPapers database.

Immediate OA APC is 2583 EUR. Non-OA / submission fee is 0 EUR.

The acceptance rate recorded for X-Ray Spectrometry is 31%.

X-Ray Spectrometry

Metrics

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Researcher reviews

Best articles by citations

FAQs

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What is the acceptance rate?