ISSN: 1286-0042

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EPJ Applied Physics Q4 Unclaimed

EDP Sciences France

Unfortunately this journal has not been claimed yet. For this reason, some information may be unavailable.

EPJ Applied Physics is a journal indexed in SJR in Electronic, Optical and Magnetic Materials and Condensed Matter Physics with an H index of 58. It has an SJR impact factor of 0,182 and it has a best quartile of Q4. It is published in English. It has an SJR impact factor of 0,182.

Type: Journal

Type of Copyright:

Languages: English

Open Access Policy:

Type of publications:

Publication frecuency: -

Categories: Condensed Matter Physics (Q4) Electronic, Optical and Magnetic Materials (Q4) Instrumentation (Q4)

Price

- €

Inmediate OA

NPD

Embargoed OA

- €

Non OA

Metrics

0,182

SJR Impact factor

58

H Index

29

Total Docs (Last Year)

233

Total Docs (3 years)

1171

Total Refs

185

Total Cites (3 years)

228

Citable Docs (3 years)

0.86

Cites/Doc (2 years)

40.38

Ref/Doc

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Progress In Electromagnetics Research M Q4
Progress In Electromagnetics Research Letters Q4
Chinese Journal of Luminescence Q4
Journal of Nanophotonics Q4
Nanosistemi, Nanomateriali, Nanotehnologii Q4

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Aims and Scope

Best articles by citations

Solutions multiples thermocapillaires en zone flottante a gravite nulle

Anti-Stokes luminescence in nitrogen doped GaAs1-xPxalloys

Parallel computing for the finite element method

Dispositif de mesure de pertes dans les conducteurs supraconducteurs utilises en regime variable

High resolution microscopy techniques for the analysis of biological samples: a comparison

Structural and electrical properties of as-deposited and annealed DC sputtered ITO thin films

Transformation threshold and time-dependent TAF generation in an angiogenesis model

Pneumatic protection applied to an airbag for para-gliders

Estimating a conductivity distributionviaa FEM-based nonlinear Bayesian method

Simulation of differential circumferential wave induced by a laser pulse in hollow cylinder with an inner surface defect

Infrared characterization of environmental samples by pulsed photothermal spectroscopy

evaluation du potentiel electrique a la surface des dispositifs enrobes

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Caracterisation des changements de phase developpes dans un alliage AMF du type Cu-Al-Ni, par dilatometrie de trempe et microcalorimetrie differentielle

The effect of suspension concentration on the buildup evolution in a HGMF-axial magnetic filter

Dimensionnement et realisation d'un SMES impulsionnel de 500 J

Rapid determination of the thermophysical properties of various materials. Method of the hot plane film

Scattering and coupling effects of electromagnetic waves in 3D networks of spheres

Effect of oxidation treatments on the redistribution of the boron in the thin films of polycrystalline silicon Si-LPCVD used in VLSI

Incorporation of porosity to control the residual thermal stresses in ceramic composites and laminates

HTc pour la limitation du courant

High density plasma enhanced chemical vapor deposition of optical thin films

Fast-passage microwave molecular spectroscopy with frequency sweeping

Influence of the pulse number and fluence of a nanosecond laser on the ablation rate of metals, semiconductors and dielectrics

DC pulsed plasma surface treatment of polystyrene thin films with nitrogen: study of the correlation between energy distribution and wettability