Default: Journal of X-Ray Science and Technology

ISSN: 0895-3996

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Journal of X-Ray Science and Technology Q2 Unclaimed

IOS Press BV Netherlands
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Journal of X-Ray Science and Technology is a journal indexed in SJR in Condensed Matter Physics and Electrical and Electronic Engineering with an H index of 39. It has an SJR impact factor of 0,501 and it has a best quartile of Q2. It is published in English. It has an SJR impact factor of 0,501.

Type: Journal

Type of Copyright:

Languages: English

Open Access Policy:

Type of publications:

Publication frecuency: -

Metrics

Journal of X-Ray Science and Technology

0,501

SJR Impact factor

39

H Index

84

Total Docs (Last Year)

273

Total Docs (3 years)

2514

Total Refs

670

Total Cites (3 years)

273

Citable Docs (3 years)

2.05

Cites/Doc (2 years)

29.93

Ref/Doc

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