Default: Surface and Interface Analysis

ISSN: 0142-2421

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Surface and Interface Analysis Q2 Unclaimed

John Wiley and Sons Ltd United Kingdom
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Surface and Interface Analysis is a journal indexed in SJR in Materials Chemistry and Surfaces, Coatings and Films with an H index of 96. It has a price of 3333 €. It has an SJR impact factor of 0,394 and it has a best quartile of Q2. It is published in English. It has an SJR impact factor of 0,394.

Surface and Interface Analysis focuses its scope in these topics and keywords: prepared, xps, characterization, interfacial, glancing, investigations, linesspectroscopic, liquidliquid, macromolecular, method, ...

Type: Journal

Type of Copyright:

Languages: English

Open Access Policy: Open Choice

Type of publications:

Publication frecuency: -


Surface and Interface Analysis


SJR Impact factor


H Index


Total Docs (Last Year)


Total Docs (3 years)


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Total Cites (3 years)


Citable Docs (3 years)


Cites/Doc (2 years)




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Aims and Scope

prepared, xps, characterization, interfacial, glancing, investigations, linesspectroscopic, liquidliquid, macromolecular, method, morphological, nanowhiskers, optical, porous, precipitation, properties, pseudovoigt, absorption, silicacoated, sims, cosmetic, angle, application, applicationsnanodomain, architecturethe, asymmetric, brush, characteristics, cluster, analysisa, depositionstructural, efficient, electrical, ellipsometry, films, fitting, formed,

Best articles by citations

Visualization of a plasma-generated chemical micro-pattern on polystyrene by XPS

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Structural investigations of ternary chalcogenide glasses

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Use of Auger imaging for three-dimensional visualization of interface morphology at isoconcentration

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Nb2O5 thin films obtained by chemical spray pyrolysis

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Lorentz-force-induced excitation of cantilevers for oscillation-mode scanning probe microscopy

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Self-organization of nanostructured copper filament array by electrochemical deposition

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Parametric analysis of the extraction of depth profile information from ARXPS data obtained on a silicon wafer sample

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Corrosion behaviour of coated cellular material

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Study of interfacial chemistry on direct curing adhesion between Ni-P plating and rubber using 1,3,5-triazine-2,4,6-trithiol monosodium salt

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Investigation on the interaction mechanism between nanocellulose and adhesion RH

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Corrosion behaviour of gold surfaces protected with bonded perfluoro polyethers

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Quantitative analysis of AuPd alloys from the shape of XPS spectra by the fuzzy rule

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Surface analysis of Co-Cr-Mo alloy and Ti substrates silanized with trialkoxysilanes and silane mixtures

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Investigation into the surface selective oxidation of dual-phase steels by XPS, SAM and SIMS

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High-energy monochromated Cu Ka1 x-ray source for electron spectroscopy of materials: initial results

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Self-organized organic nanostructures: structure formation in thin polymer blend films

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Surface segregation of silicon impurities in organic materials

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Quantitative surface chemical-state microscopy by x-ray photoelectron spectroscopy

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Surface analysis of(NH2)2CS-treated GaP(001) by AES and XPS

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Electron-beam-induced decomposition of trimethylamine on Si(100)-2 ?o 1

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Surface smoothing of single-crystal diamond by high-speed cluster impacts with and without reactive erosion

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Study of structural relaxation in alloys of metallic glasses

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Formation of Au nanocrystals in ceramic oxides by ion implantation

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Interface effects for very thin Al films deposited onto Cu, Si and SiO2 substrates

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