verified SJR 0,397 · Q3 • database Scopus / SJR & Web of Science indexed

United Kingdom · John Wiley and Sons Ltd

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Surface and Interface Analysis

Surface and Interface Analysis is a journal indexed in SJR in Materials Chemistry and Surfaces, Coatings and Films with an H index of 103. It has a price of 3333 €. It has an SJR impact factor of 0,397 and it has a best quartile of Q3. It is published in English. It has an SJR impact factor of 0,397.

Surface and Interface Analysis focuses its scope in these topics and keywords: characterization, xps, prepared, sunscreen, cosmetic, function, glancing, pseudovoigt, characteristics, architecturethe, ...

ISSN: 0142-2421

Editorial: John Wiley and Sons Ltd

Category: Materials Chemistry

Indexation: verifiedScopus / SJR verifiedWeb of Science

Unclaimed profile — some fields may be incomplete.

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SJR Impact Factor trending_up

0,397 Q3

H-index 103

Tasa de Aceptación pie_chart

25% Selectiva

Fuente Acceptance_Rate

Tiempo a publicación hourglass_top

NPD

Campo Sin dato

Coste de Publicación (APC) payments

3.333 € Open Access

Ruta Non-OA 0 €

Metrics

Campos Scimago / CoP — sin series inventadas

Scopus / SJR Web of Science

SJR Impact

0,397

H-index

103

Docs (year)

Docs 3y

336

Total refs

3311

Cites 3y

607

Citable 3y

331

Cites/Doc 2y

1.7

Ref/Doc

40.38

Immediate OA

3333 €

Embargoed OA

NPD

Non OA / Submission

0 €

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Best articles by citations

Comparative thickness measurements of SiO2/Si films for thicknesses less than 10 nm

XPS depth profile study of porous zirconia films deposited on stainless steel by spray pyrolysis: the problem of substrate corrosion

Electron-beam-induced decomposition of trimethylamine on Si(100)-2 ?o 1

Electron spectroscopic investigation of ethylmethylsulfide/nickel interface

Electron beam effects on diethylsilane-covered Si(100) surfaces investigated by x-ray photoelectron spectroscopy

Electron beam effects on diethylsilane-covered Si(100) surfaces investigated by electron stimulated and temperature programmed desorption

Effect of aluminium content on the coating structure and dross formation in the hot-dip galvanizing process

Determination of ZnO(0001) surface termination by x-ray photoelectron spectroscopy at photoemission angles of 0º and 70º

Depth profiling of thin films of binary metal oxides

Corrosion performance of a two-step pre-treatment for galvanized steel based on lanthanum nitrate and silanes

Corrosion behaviour of gold surfaces protected with bonded perfluoro polyethers

Corrosion behaviour of coated cellular material

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Controlled structuring of mica surfaces with the tip of an atomic force microscope by mechanically induced local etching

A more general method for ranking the enrichment of alloying elements in passivation films

Combined use of XPS and SEM+ EDS for the study of surface microchemical structure of archaeological bronze Roman mirrors

Characterization of metal decorated protein templates by scanning electron/scanning force microscopy and microanalysis

Characterization of delta-doped B/Si multilayers by low-energy secondary ion mass spectrometry

Characterization of chromate conversion coating on AA7075-T6 aluminum alloy

Carrier density and confined polaron effects in the photoluminescence of fresh and oxidized porous silicon

Are measured values of the Auger parameter always independent of charging effects?

Application of x-ray photoemission electron microscopy developed at SPring-8 BL15XU

Annealing of low-temperature growth in Ag/Si(111) as measured by RHEED spot profile analysis

Analysis of labelled gas movements at metal/oxide interfaces by secondary ion mass spectrometry

AES, XPS and EDS analyses of an iron-based magnetic powder and an SMC material

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