ISSN: 1040-8436

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Critical Reviews in Solid State and Materials Sciences Q1 Unclaimed

Taylor and Francis Ltd. United Kingdom

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Critical Reviews in Solid State and Materials Sciences is a journal indexed in SJR in Chemical Engineering (miscellaneous) and Electronic, Optical and Magnetic Materials with an H index of 75. It has a price of 2395 €. It has an SJR impact factor of 1,959 and it has a best quartile of Q1. It is published in English. It has an SJR impact factor of 1,959.

Type: Journal

Type of Copyright:

Languages: English

Open Access Policy:

Type of publications:

Publication frecuency: -

Categories: Chemical Engineering (miscellaneous) (Q1) Condensed Matter Physics (Q1) Electrical and Electronic Engineering (Q1) Electronic, Optical and Magnetic Materials (Q1) Physical and Theoretical Chemistry (Q1)

Price

2395 €

Inmediate OA

NPD

Embargoed OA

0 €

Non OA

Metrics

Critical Reviews in Solid State and Materials Sciences

1,959

SJR Impact factor

75

H Index

44

Total Docs (Last Year)

64

Total Docs (3 years)

9175

Total Refs

840

Total Cites (3 years)

64

Citable Docs (3 years)

12.75

Cites/Doc (2 years)

208.52

Ref/Doc

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Aims and Scope

Best articles by citations

Thermal Fixation of the Photorefractive Holograms Recorded in Lithium Niobate and Related Crystals

Polymeric optical disk recording media

The physics and applications of n-i-p-i doping superlattices

Application of molecular dynamics simulations to the study of ion-bombarded metal surfaces

Epitaxial crystal growth by sputter deposition: Applications to semiconductors. Part I

The application of controlled superconductors in linear amplifier circuits

Reactive Phase Formation in Thin Film Metal/Metal and Metal/Silicon Diffusion Couples

High-Efficiency Silicon Solar Cells - Materials and Devices Physics

Schottky barrier formation on iii-v semiconductor surfaces: A critical evaluation

Copper Indium Selenides and Related Materials for Photovoltaic Devices

Excitation and recombination processes during electroluminescence of rare earth-activated materials

Temperature Measurement in Rapid Thermal Processing with Focus on the Application to Flash Lamp Annealing

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Metalorganic chemical vapor deposition

Squid biomagnetic measurements

Surface and adsorbate structural studies by photoemission in the hv = 50- TO 500-eV Range

Molecular beam epitaxy of III-V semiconductors

Diffusion in surface layers

The Electronic Properties of Nanomaterials Elucidated by Synchrotron Radiation-Based Spectroscopy

Photovoltaic devices

3C-SiC Heteroepitaxial Growth on Silicon: The Quest for Holy Grail

Point defects, diffusion mechanisms, and superlattice disordering in gallium arsenide-based materials

High-resolution electron energy loss spectroscopy

Recent applications of field emission microscopy

Arsenic passivation of Si and Ge surfaces