ISSN: 1537-0755

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Electronic Device Failure Analysis Q4 Unclaimed

ASM International United States

Unfortunately this journal has not been claimed yet. For this reason, some information may be unavailable.

Electronic Device Failure Analysis is a journal indexed in SJR in Electrical and Electronic Engineering and Safety, Risk, Reliability and Quality with an H index of 7. It has an SJR impact factor of 0,125 and it has a best quartile of Q4. It is published in English. It has an SJR impact factor of 0,125.

Type: Journal

Type of Copyright:

Languages: English

Open Access Policy:

Type of publications:

Publication frecuency: -

Categories: Electrical and Electronic Engineering (Q4) Safety, Risk, Reliability and Quality (Q4)

Price

- €

Inmediate OA

NPD

Embargoed OA

- €

Non OA

Metrics

0,125

SJR Impact factor

7

H Index

34

Total Docs (Last Year)

94

Total Docs (3 years)

283

Total Refs

11

Total Cites (3 years)

39

Citable Docs (3 years)

0.09

Cites/Doc (2 years)

8.32

Ref/Doc

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