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SJR 0,131 · Q4
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Scopus / SJR indexed
United States · ASM International
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Q4 — Electrical and Electronic Engineering
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Electronic Device Failure Analysis
Electronic Device Failure Analysis is a journal indexed in SJR in Electrical and Electronic Engineering and Safety, Risk, Reliability and Quality with an H index of 7. It has an SJR impact factor of 0,131 and it has a best quartile of Q4. It is published in English. It has an SJR impact factor of 0,131.
ISSN: 1537-0755
Publisher: ASM International
Category: Electrical and Electronic Engineering
Indexation:
verifiedScopus / SJR
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CountryOfPapers database fields
SJR Impact Factor
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0,131
Q4
H-index
7
Acceptance rate
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57%
Source
Acceptance_Rate
Time to publication
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NPD
Field
NPD
Publication cost (APC)
payments
NPD
Subscription
Non-OA path
NPD
Metrics
Scimago and CountryOfPapers database fields
Scopus / SJR
SJR Impact
0,131
H-index
7
Docs (year)
21
Docs 3y
94
Total refs
310
Cites 3y
17
Citable 3y
42
Cites/Doc 2y
0.16
Ref/Doc
14.76
Immediate OA
—
Embargoed OA
NPD
Non OA / Submission
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