ISSN: 1537-0755

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Electronic Device Failure Analysis Q4 Unclaimed

ASM International United States

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Electronic Device Failure Analysis is a journal indexed in SJR in Electrical and Electronic Engineering and Safety, Risk, Reliability and Quality with an H index of 7. It has an SJR impact factor of 0,131 and it has a best quartile of Q4. It is published in English. It has an SJR impact factor of 0,131.

Type: Journal

Type of Copyright:

Languages: English

Open Access Policy:

Type of publications:

Publication frecuency: -

Categories: Electrical and Electronic Engineering (Q4) Safety, Risk, Reliability and Quality (Q4)

Price

- €

Inmediate OA

NPD

Embargoed OA

- €

Non OA

Metrics

0,131

SJR Impact factor

7

H Index

21

Total Docs (Last Year)

94

Total Docs (3 years)

310

Total Refs

17

Total Cites (3 years)

42

Citable Docs (3 years)

0.16

Cites/Doc (2 years)

14.76

Ref/Doc

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