verified SJR 0,357 · Q3 • database Scopus / SJR & Web of Science indexed

United States · IEEE Computer Society

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IEEE Design and Test

IEEE Design and Test is a journal indexed in SJR in Software and Electrical and Electronic Engineering with an H index of 87. It has an SJR impact factor of 0,357 and it has a best quartile of Q3. It has an SJR impact factor of 0,357.

ISSN: 2168-2356

Publisher: IEEE Computer Society

Category: Software

Indexation: verifiedScopus / SJR verifiedWeb of Science

open_in_new Portal NPD menu_book Guidelines NPD

schedule CountryOfPapers database fields

SJR Impact Factor trending_up

0,357 Q3

H-index 87

Acceptance rate pie_chart

26% Selective

Source Acceptance_Rate

Time to publication hourglass_top

NPD

Field NPD

Publication cost (APC) payments

NPD Subscription

Non-OA path NPD

Metrics

Scimago and CountryOfPapers database fields

Scopus / SJR Web of Science

SJR Impact

0,357

H-index

Docs (year)

Docs 3y

262

Total refs

856

Cites 3y

403

Citable 3y

230

Cites/Doc 2y

1.6

Ref/Doc

10.07

Immediate OA

—

Embargoed OA

NPD

Non OA / Submission

—

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Best articles by citations

Sensor Driven Reliability and Wearout Management

Test Challenges for 3D Integrated Circuits

The Embedded Object Concept: a Lego-like Approach to Making Embedded Systems

The Joy of Scheduling

Time Out of Mind

Time-Critical Systems Design, Part II

TTTC News

Variability and Reliability Awareness in the Age of Dark Silicon

VPOS: A Specific Operating System for the FPGA Verification of Microprocessor System-level Functions

The Art of Certifying Analog/Mixed-Signal Circuits

Speeding Up Analog Integration and Test for Mixed-Signal SoCs [From the EIC]

Silicon Nanophotonics

SHOW MORE ARTICLES

Statistics in Semiconductor Test, Going Beyond Yield

Robust On-chip Signaling by Staggered and Twisted Bundle

Report of the 2015 Embedded Systems Week (ESWEEK)

Physical Design and CAD Tools for 3-D Integrated Circuits: Challenges and Opportunities

Parameter-Invariant Design of Medical Alarms

Parallelizing GPGPU-Sim for Faster Simulation with High Fidelity

Overview of 3-D Architecture Design Opportunities and Techniques

Overcoming Early-Life Failure and Aging Challenges for Robust System Design

Opportunities and Challenges for 3D Systems and Their Design

Modeling Low-K Dielectric Breakdown in the Presence of Multiple Feature Geometries and Die-to-Die Linewidth Variation

Layout-Aware Optimized Prebond Silicon Interposer Test Synthesis

Hierarchical Test Integration Methodology for 3-D ICs

FAQs

IEEE Design and Test has an SJR of 0,357 (best quartile Q3) in the CountryOfPapers database.

Immediate OA APC is not available (NPD).

The acceptance rate recorded for IEEE Design and Test is 26%.

IEEE Design and Test

Metrics

Name good journals. Call out predatory ones.

Researcher reviews

Best articles by citations

FAQs

What is the SJR of IEEE Design and Test?

What is the APC / publication cost?

What is the acceptance rate?