Default: IEEE Design and Test

ISSN: 2168-2356

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IEEE Design and Test Q2 Unclaimed

IEEE Computer Society United States
Unfortunately this journal has not been claimed yet. For this reason, some information may be unavailable.

IEEE Design and Test is a journal indexed in SJR in Software and Electrical and Electronic Engineering with an H index of 85. It has an SJR impact factor of 0,489 and it has a best quartile of Q2. It has an SJR impact factor of 0,489.

Type: Journal

Type of Copyright:

Languages:

Open Access Policy:

Type of publications:

Publication frecuency: -

Price

- €

Inmediate OA

NPD

Embargoed OA

- €

Non OA

Metrics

IEEE Design and Test

0,489

SJR Impact factor

85

H Index

92

Total Docs (Last Year)

261

Total Docs (3 years)

1197

Total Refs

407

Total Cites (3 years)

225

Citable Docs (3 years)

1.51

Cites/Doc (2 years)

13.01

Ref/Doc

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