IEEE Transactions on Components, Packaging and Manufacturing Technology
IEEE Transactions on Components, Packaging and Manufacturing Technology is a journal indexed in SJR in Industrial and Manufacturing Engineering and Electronic, Optical and Magnetic Materials with an H index of 119. It has a price of 2040 €. It has an SJR impact factor of 0,716 and it has a best quartile of Q1. It has an SJR impact factor of 0,716.
Metrics
Scimago and CountryOfPapers database fields
SJR Impact
0,716
H-index
119
Docs (year)
278
Docs 3y
664
Total refs
8875
Cites 3y
2441
Citable 3y
661
Cites/Doc 2y
3.53
Ref/Doc
31.92
Immediate OA
2040 €
Embargoed OA
NPD
Non OA / Submission
0 €
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Best articles by citations
Characterization and Estimation of Solder-on-Pad Process for Fine-Pitch Applications
View moreVolume Shrinkage Characterization of Underfill Materials
View moreDesign and Development of Multi-Die Laterally Placed and Vertically Stacked Embedded Micro-Wafer-Level Packages
View moreCross Flow Heat Exchanger Modeling of Transient Temperature Input Conditions
View moreCreep Behaviors of Sn0.7Cu0.1Co0.05Ni/Cu Soldering Joints
View moreCorrelation Between Solder Joint Fatigue Life and Accumulated Work in Isothermal Cycling
View moreCorrections to Graham's Law of Effusion for Predicting Leak Rates Through Hermetic Seals
View moreConductive Adhesives From Low-VOC Silver Inks for Advanced Microelectronics Applications
View moreCommon-Mode Noise Reduction Schemes for Weakly Coupled Differential Serpentine Delay Microstrip Lines
View moreClassification of Solder Joint Using Feature Selection Based on Bayes and Support Vector Machine
View moreCircuit Models of Carbon-Based Interconnects for Nanopackaging
View moreChip-Level Simultaneous Switching Current Measurement in Power Distribution Network Using Magnetically Coupled Embedded Current Probing Structure
View moreCharacterization Methods for Ultrathin Wafer and Die Quality: A Review
View more3-D Packaging With Through-Silicon Via (TSV) for Electrical and Fluidic Interconnections
View moreChallenges for Capillary Self-Assembly of Microsystems
View moreBehavioral Modeling of IC Core Power-Delivery Networks From Measured Data
View moreApplication of Sequence-Dependent Traveling Salesman Problem in Printed Circuit Board Assembly
View moreAn Experimental and Numerical Investigation Into Wafer Probing Parameters Based on Thin Wafer Breaking Strength
View moreA Wideband On-Interposer Passive Equalizer Design for Chip-to-Chip 30-Gb/s Serial Data Transmission
View moreA Systematic Method for the Passivity Enforcement of Delayed Rational Macromodels
View moreA Study on the Failure Mechanism and Enhanced Reliability of Sn58Bi Solder Anisotropic Conductive Film Joints in a Pressure Cooker Test Due to Polymer Viscoelastic Properties and Hydroswelling
View moreA Study on the Bonding Conditions and Nonconductive Filler Contents on Cationic Epoxy-Based Sn-58Bi Solder ACFs Joints for Reliable Flex-on-Board Applications
View moreA Silicon-Based LED Packaging Substrate With an Island Structure for Phosphor Encapsulation Shaping
View moreA Novel Layer Stack-Up With Free Cavity Resonance for High-Performance Power Noise Suppression
View more