Journal list Promote Sponsor
verified SJR 0,716 · Q1 • database Scopus / SJR & Web of Science indexed
IEEE Transactions on Components, Packaging and Manufacturing Technology
United States · Institute of Electrical and...
workspace_premium Q1 — Industrial and Manufacturing Engineering lock Subscription

IEEE Transactions on Components, Packaging and Manufacturing Technology

IEEE Transactions on Components, Packaging and Manufacturing Technology is a journal indexed in SJR in Industrial and Manufacturing Engineering and Electronic, Optical and Magnetic Materials with an H index of 119. It has a price of 2040 €. It has an SJR impact factor of 0,716 and it has a best quartile of Q1. It has an SJR impact factor of 0,716.

ISSN: 2156-3950
Publisher: Institute of Electrical and Electronics Engineers Inc.
Category: Industrial and Manufacturing Engineering
Indexation: verifiedScopus / SJR verifiedWeb of Science
open_in_new Portal NPD menu_book Guidelines NPD
schedule CountryOfPapers database fields
SJR Impact Factor trending_up
0,716 Q1
H-index 119
Acceptance rate pie_chart
30% Selective
Source Acceptance_Rate
Time to publication hourglass_top
NPD
Field NPD
Publication cost (APC) payments
2.040 € Subscription
Non-OA path 0 €

Metrics

Scimago and CountryOfPapers database fields

Scopus / SJR Web of Science

SJR Impact

0,716

H-index

119

Docs (year)

278

Docs 3y

664

Total refs

8875

Cites 3y

2441

Citable 3y

661

Cites/Doc 2y

3.53

Ref/Doc

31.92

Immediate OA

2040 €

Embargoed OA

NPD

Non OA / Submission

0 €

shield Researcher voice

Name good journals. Call out predatory ones.

Share what peer review, fees, and timelines were really like. Praise fair editors. Flag APC traps, fake metrics, or spam solicitations — with facts from your submission.

Fair & fast peer review Clear APC / no surprise fees Suspected predatory Fake impact claims
rate_review Write an honest review

Researcher reviews

sentiment_dissatisfied No reviews yet — be the first to share an honest experience.
User
* Only to validate authenticity — identity is not shown publicly.

Best articles by citations

Characterization and Estimation of Solder-on-Pad Process for Fine-Pitch Applications

View more

Volume Shrinkage Characterization of Underfill Materials

View more

Design and Development of Multi-Die Laterally Placed and Vertically Stacked Embedded Micro-Wafer-Level Packages

View more

Cross Flow Heat Exchanger Modeling of Transient Temperature Input Conditions

View more

Creep Behaviors of Sn0.7Cu0.1Co0.05Ni/Cu Soldering Joints

View more

Correlation Between Solder Joint Fatigue Life and Accumulated Work in Isothermal Cycling

View more

Corrections to Graham's Law of Effusion for Predicting Leak Rates Through Hermetic Seals

View more

Conductive Adhesives From Low-VOC Silver Inks for Advanced Microelectronics Applications

View more

Common-Mode Noise Reduction Schemes for Weakly Coupled Differential Serpentine Delay Microstrip Lines

View more

Classification of Solder Joint Using Feature Selection Based on Bayes and Support Vector Machine

View more

Circuit Models of Carbon-Based Interconnects for Nanopackaging

View more

Chip-Level Simultaneous Switching Current Measurement in Power Distribution Network Using Magnetically Coupled Embedded Current Probing Structure

View more
SHOW MORE ARTICLES

Characterization Methods for Ultrathin Wafer and Die Quality: A Review

View more

3-D Packaging With Through-Silicon Via (TSV) for Electrical and Fluidic Interconnections

View more

Challenges for Capillary Self-Assembly of Microsystems

View more

Behavioral Modeling of IC Core Power-Delivery Networks From Measured Data

View more

Application of Sequence-Dependent Traveling Salesman Problem in Printed Circuit Board Assembly

View more

An Experimental and Numerical Investigation Into Wafer Probing Parameters Based on Thin Wafer Breaking Strength

View more

A Wideband On-Interposer Passive Equalizer Design for Chip-to-Chip 30-Gb/s Serial Data Transmission

View more

A Systematic Method for the Passivity Enforcement of Delayed Rational Macromodels

View more

A Study on the Failure Mechanism and Enhanced Reliability of Sn58Bi Solder Anisotropic Conductive Film Joints in a Pressure Cooker Test Due to Polymer Viscoelastic Properties and Hydroswelling

View more

A Study on the Bonding Conditions and Nonconductive Filler Contents on Cationic Epoxy-Based Sn-58Bi Solder ACFs Joints for Reliable Flex-on-Board Applications

View more

A Silicon-Based LED Packaging Substrate With an Island Structure for Phosphor Encapsulation Shaping

View more

A Novel Layer Stack-Up With Free Cavity Resonance for High-Performance Power Noise Suppression

View more

FAQs