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verified SJR 1,471 · Q1 • database Scopus / SJR & Web of Science indexed
IEEE Transactions on Instrumentation and Measurement
United States · Institute of Electrical and...
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IEEE Transactions on Instrumentation and Measurement

IEEE Transactions on Instrumentation and Measurement is a journal indexed in SJR in Electrical and Electronic Engineering and Instrumentation with an H index of 163. It has an SJR impact factor of 1,471 and it has a best quartile of Q1. It is published in English. It has an SJR impact factor of 1,471.

IEEE Transactions on Instrumentation and Measurement focuses its scope in these topics and keywords: probe, application, measurement, measurements, method, determination, gaussian, hydrogen, infrared, biometric, ...

ISSN: 0018-9456
Publisher: Institute of Electrical and Electronics Engineers Inc.
Category: Electrical and Electronic Engineering
Indexation: verifiedScopus / SJR verifiedWeb of Science
open_in_new Portal NPD menu_book Guidelines NPD
schedule CountryOfPapers database fields
SJR Impact Factor trending_up
1,471 Q1
H-index 163
Acceptance rate pie_chart
23% Selective
Source Acceptance_Rate
Time to publication hourglass_top
NPD
Field NPD
Publication cost (APC) payments
NPD Subscription
Non-OA path NPD

Metrics

Scimago and CountryOfPapers database fields

Scopus / SJR Web of Science

SJR Impact

1,471

H-index

163

Docs (year)

2655

Docs 3y

5799

Total refs

107466

Cites 3y

39571

Citable 3y

5782

Cites/Doc 2y

6.46

Ref/Doc

40.48

Immediate OA

—

Embargoed OA

NPD

Non OA / Submission

—

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