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verified SJR 1,264 · Q1 • database Scopus / SJR & Web of Science indexed
IEEE Transactions on Reliability
United States · Institute of Electrical and...
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IEEE Transactions on Reliability

IEEE Transactions on Reliability is a journal indexed in SJR in Electrical and Electronic Engineering and Safety, Risk, Reliability and Quality with an H index of 125. It has an SJR impact factor of 1,264 and it has a best quartile of Q1. It is published in English. It has an SJR impact factor of 1,264.

IEEE Transactions on Reliability focuses its scope in these topics and keywords: reliability, vol, transactions, prognostics, transistor, index, ieee, comparison, feature, profust, ...

Publisher: Institute of Electrical and Electronics Engineers Inc.
Category: Electrical and Electronic Engineering
Indexation: verifiedScopus / SJR verifiedWeb of Science
open_in_new Portal NPD menu_book Guidelines NPD
schedule CountryOfPapers database fields
SJR Impact Factor trending_up
1,264 Q1
H-index 125
Acceptance rate pie_chart
24% Selective
Source Acceptance_Rate
Time to publication hourglass_top
NPD
Field NPD
Publication cost (APC) payments
NPD Subscription
Non-OA path NPD

Metrics

Scimago and CountryOfPapers database fields

Scopus / SJR Web of Science

SJR Impact

1,264

H-index

125

Docs (year)

285

Docs 3y

360

Total refs

9708

Cites 3y

2586

Citable 3y

355

Cites/Doc 2y

6.68

Ref/Doc

34.06

Immediate OA

—

Embargoed OA

NPD

Non OA / Submission

—

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