Default: IEEE Transactions on Reliability

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IEEE Transactions on Reliability Q1 Unclaimed

Institute of Electrical and Electronics Engineers Inc. United States
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IEEE Transactions on Reliability is a journal indexed in SJR in Electrical and Electronic Engineering and Safety, Risk, Reliability and Quality with an H index of 114. It has an SJR impact factor of 1,296 and it has a best quartile of Q1. It is published in English. It has an SJR impact factor of 1,296.

IEEE Transactions on Reliability focuses its scope in these topics and keywords: reliability, ieee, vol, index, transistor, transactions, prognostics, distributed, issues, insulated, ...

Type: Journal

Type of Copyright:

Languages: English

Open Access Policy:

Type of publications:

Publication frecuency: -

Price

- €

Inmediate OA

NPD

Embargoed OA

- €

Non OA

Metrics

IEEE Transactions on Reliability

1,296

SJR Impact factor

114

H Index

181

Total Docs (Last Year)

294

Total Docs (3 years)

5235

Total Refs

1951

Total Cites (3 years)

292

Citable Docs (3 years)

6.8

Cites/Doc (2 years)

28.92

Ref/Doc

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Aims and Scope


reliability, ieee, vol, index, transistor, transactions, prognostics, distributed, issues, insulated, identification, health, hardware, gate, failures, extraction, evolvable, error, approach, determinationprecursor, deterioration, detection, managementacedr, cpu, cots, condition, compiler, anomaly, classification, case, cachesreliability, bipolar, based,

FAQS