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IEEE Transactions on Reliability Q1 Unclaimed
Institute of Electrical and Electronics Engineers Inc.
United States
IEEE Transactions on Reliability is a journal indexed in SJR in Electrical and Electronic Engineering and Safety, Risk, Reliability and Quality with an H index of 114. It has an SJR impact factor of 1,296 and it has a best quartile of Q1. It is published in English. It has an SJR impact factor of 1,296.
IEEE Transactions on Reliability focuses its scope in these topics and keywords: reliability, ieee, vol, index, transistor, transactions, prognostics, distributed, issues, insulated, ...
Type: Journal
Type of Copyright:
Languages: English
Open Access Policy:
Type of publications:
Publication frecuency: -
Price
- €
Inmediate OANPD
Embargoed OA- €
Non OAMetrics
1,296
SJR Impact factor114
H Index181
Total Docs (Last Year)294
Total Docs (3 years)5235
Total Refs1951
Total Cites (3 years)292
Citable Docs (3 years)6.8
Cites/Doc (2 years)28.92
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