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IEEE Transactions on Reliability Q1 Unclaimed

Institute of Electrical and Electronics Engineers Inc. United States

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IEEE Transactions on Reliability is a journal indexed in SJR in Electrical and Electronic Engineering and Safety, Risk, Reliability and Quality with an H index of 118. It has an SJR impact factor of 1,511 and it has a best quartile of Q1. It is published in English. It has an SJR impact factor of 1,511.

IEEE Transactions on Reliability focuses its scope in these topics and keywords: reliability, transistor, index, prognostics, transactions, ieee, vol, feature, failures, extraction, ...

Type: Journal

Type of Copyright:

Languages: English

Open Access Policy:

Type of publications:

Publication frecuency: -

Categories: Electrical and Electronic Engineering (Q1) Safety, Risk, Reliability and Quality (Q1)

Price

- €

Inmediate OA

NPD

Embargoed OA

- €

Non OA

Metrics

1,511

SJR Impact factor

118

H Index

171

Total Docs (Last Year)

331

Total Docs (3 years)

5782

Total Refs

2251

Total Cites (3 years)

328

Citable Docs (3 years)

5.97

Cites/Doc (2 years)

33.81

Ref/Doc

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