IEEE Transactions on Reliability
IEEE Transactions on Reliability is a journal indexed in SJR in Electrical and Electronic Engineering and Safety, Risk, Reliability and Quality with an H index of 125. It has an SJR impact factor of 1,264 and it has a best quartile of Q1. It is published in English. It has an SJR impact factor of 1,264.
IEEE Transactions on Reliability focuses its scope in these topics and keywords: reliability, vol, transactions, prognostics, transistor, index, ieee, comparison, feature, profust, ...
Metrics
Scimago and CountryOfPapers database fields
SJR Impact
1,264
H-index
125
Docs (year)
285
Docs 3y
360
Total refs
9708
Cites 3y
2586
Citable 3y
355
Cites/Doc 2y
6.68
Ref/Doc
34.06
Immediate OA
—
Embargoed OA
NPD
Non OA / Submission
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