Default: IEEE Transactions on Very Large Scale Integration (VLSI) Systems

ISSN: 1063-8210

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IEEE Transactions on Very Large Scale Integration (VLSI) Systems Q2 Unclaimed

Institute of Electrical and Electronics Engineers Inc. United States
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IEEE Transactions on Very Large Scale Integration (VLSI) Systems is a journal indexed in SJR in Software and Electrical and Electronic Engineering with an H index of 105. It has an SJR impact factor of 0,506 and it has a best quartile of Q2. It is published in English. It has an SJR impact factor of 0,506.

IEEE Transactions on Very Large Scale Integration (VLSI) Systems focuses its scope in these topics and keywords: active, faults, power, noise, cmos, detectability, drivers, dynamic, deskewing, analysismanaging, ...

Type: Journal

Type of Copyright:

Languages: English

Open Access Policy:

Type of publications:

Publication frecuency: -

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Metrics

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

0,506

SJR Impact factor

105

H Index

257

Total Docs (Last Year)

887

Total Docs (3 years)

8001

Total Refs

2867

Total Cites (3 years)

878

Citable Docs (3 years)

3,15

Cites/Doc (2 years)

31,13

Ref/Doc

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Aims and Scope


active, faults, power, noise, cmos, detectability, drivers, dynamic, deskewing, analysismanaging, differential, energy, energyaware, enhancement, escapes, estimation, exponentiation, feedforward, gain, design, currentsa, architecture, automated, boosting, cancellation, capacitances, cardenergyefficient, caused, channel, chipsoptimum, clock, compressionpsr, consumption, cord, cryptosystemselftimed,



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Fast floorplanning for effective prediction and construction

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Effective Radii of On-Chip Decoupling Capacitors

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Locally clocked pipelines and dynamic logic

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CPU Architecture Based on a Hardware Scheduler and Independent Pipeline Registers

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A New Self-Healing Methodology for RF Amplifier Circuits Based on Oscillation Principles

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