Default: International Journal of Numerical Modelling: Electronic Networks, Devices and Fields

ISSN: 0894-3370

Journal Home

Journal Guideline

International Journal of Numerical Modelling: Electronic Networks, Devices and Fields Q3 Unclaimed

John Wiley and Sons Ltd United Kingdom
Unfortunately this journal has not been claimed yet. For this reason, some information may be unavailable.

International Journal of Numerical Modelling: Electronic Networks, Devices and Fields is a journal indexed in SJR in Modeling and Simulation and Electrical and Electronic Engineering with an H index of 33. It has a price of 2500 €. It has an SJR impact factor of 0,393 and it has a best quartile of Q3. It is published in English. It has an SJR impact factor of 0,393.

Type: Journal

Type of Copyright:

Languages: English

Open Access Policy: Open Choice

Type of publications:

Publication frecuency: -

Price

2500 €

Inmediate OA

NPD

Embargoed OA

0 €

Non OA

Metrics

International Journal of Numerical Modelling: Electronic Networks, Devices and Fields

0,393

SJR Impact factor

33

H Index

130

Total Docs (Last Year)

412

Total Docs (3 years)

4369

Total Refs

804

Total Cites (3 years)

404

Citable Docs (3 years)

2.05

Cites/Doc (2 years)

33.61

Ref/Doc

Comments

No comments ... Be the first to comment!



Best articles by citations

Electrothermal model of optocoupler for SPICE

View more

Cyclostationary noise modeling of radio frequency devices

View more

New thin wire formulation for time-domain differential-equation models

View more

Constrained multi-objective antenna design optimization using surrogates

View more

A termination structure of 2.5kV IGBT with field plate and semi-resistive (SIPOS) layer

View more

Full hydrodynamic simulation of GaAs MESFETs

View more

Dynamic behavior of an island power system with variable-pitch wind turbines under high renewable energy penetration and high wind speed

View more

The electromagnetic effect of cooling fins

View more

RF and broadband noise investigation in High-k/Metal Gate 28-nm CMOS bulk transistor

View more

Introduction to symmetry analysis, B.J. Cantwell, Cambridge University Press, Cambridge, 2002, 654 pp, Price £ 95, ISBN: 0521771838 (hardback), price £ 35.95, ISBN: 0521777402 (paperback)

View more

Numerical differentiation in magnetic field postprocessing

View more

Modeling and comparative analysis of DC characteristics of AlGaN/GaN HEMT and MOSHEMT devices

View more
SHOW MORE ARTICLES

A novel method for wave focusing investigation in metamaterial half-space and slab lens structures

View more

A novel method of analytically extracting model parameters for stacked transformers

View more

Study on frequency selective characteristics of the microstructure metallic grating in terahertz frequency range based on the hybrid implicit explicit-pseudospectral time domain method

View more

Figures-of-merit genetic extraction for InGaAs lasers, SiGe low-noise amplifiers, and ZnSe/Ge/GaAs HBTs

View more

Semi-analytical time-domain low-frequency scattering formulation for biological applications

View more

Numerically distributed circuit parameters model on microstrip transmission line circuits and its application on CAD

View more

Rapid prototyping of MIMO-OFDM based on parity bit selected and permutation spreading

View more

Finite element method investigation of electrostatic precipitator performance

View more

The electrothermal macromodel of the MA7800 monolithic positive-voltage regulators family

View more

Concentration-dependent minority carrier lifetime in an In0.53Ga0.47As interdigitated lateral PIN photodiode model based on spin-on chemical fabrication methodology

View more

Consistency of quasi-static boundary value problems in electromagnetic modelling

View more

Finite Element Methods in Electrical Power Engineering, ABJ Reece and TW Preston, Oxford Science publications, Monographs in Electrical and Electronic Engineering, Oxford University Press, Oxford, 2000, 292 pp., '55 (hardback), ISBN 0-19-856504-6.

View more

FAQS