ISSN: 0894-3370
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International Journal of Numerical Modelling: Electronic Networks, Devices and Fields Q3 Unclaimed
International Journal of Numerical Modelling: Electronic Networks, Devices and Fields is a journal indexed in SJR in Modeling and Simulation and Electrical and Electronic Engineering with an H index of 33. It has a price of 2500 €. It has an SJR impact factor of 0,393 and it has a best quartile of Q3. It is published in English. It has an SJR impact factor of 0,393.
Type: Journal
Type of Copyright:
Languages: English
Open Access Policy: Open Choice
Type of publications:
Publication frecuency: -
2500 €
Inmediate OANPD
Embargoed OA0 €
Non OAMetrics
0,393
SJR Impact factor33
H Index130
Total Docs (Last Year)412
Total Docs (3 years)4369
Total Refs804
Total Cites (3 years)404
Citable Docs (3 years)2.05
Cites/Doc (2 years)33.61
Ref/DocOther journals with similar parameters
Mathematical Modeling and Analysis Q3
International Journal of Biomathematics Q3
Statistics and Risk Modeling Q3
ACM Transactions on Modeling and Computer Simulation Q3
Russian Journal of Numerical Analysis and Mathematical Modelling Q3
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Aims and Scope
Best articles by citations
Electrothermal model of optocoupler for SPICE
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View moreA termination structure of 2.5kV IGBT with field plate and semi-resistive (SIPOS) layer
View moreFull hydrodynamic simulation of GaAs MESFETs
View moreDynamic behavior of an island power system with variable-pitch wind turbines under high renewable energy penetration and high wind speed
View moreThe electromagnetic effect of cooling fins
View moreRF and broadband noise investigation in High-k/Metal Gate 28-nm CMOS bulk transistor
View moreIntroduction to symmetry analysis, B.J. Cantwell, Cambridge University Press, Cambridge, 2002, 654 pp, Price £ 95, ISBN: 0521771838 (hardback), price £ 35.95, ISBN: 0521777402 (paperback)
View moreNumerical differentiation in magnetic field postprocessing
View moreModeling and comparative analysis of DC characteristics of AlGaN/GaN HEMT and MOSHEMT devices
View moreA novel method for wave focusing investigation in metamaterial half-space and slab lens structures
View moreA novel method of analytically extracting model parameters for stacked transformers
View moreStudy on frequency selective characteristics of the microstructure metallic grating in terahertz frequency range based on the hybrid implicit explicit-pseudospectral time domain method
View moreFigures-of-merit genetic extraction for InGaAs lasers, SiGe low-noise amplifiers, and ZnSe/Ge/GaAs HBTs
View moreSemi-analytical time-domain low-frequency scattering formulation for biological applications
View moreNumerically distributed circuit parameters model on microstrip transmission line circuits and its application on CAD
View moreRapid prototyping of MIMO-OFDM based on parity bit selected and permutation spreading
View moreFinite element method investigation of electrostatic precipitator performance
View moreThe electrothermal macromodel of the MA7800 monolithic positive-voltage regulators family
View moreConcentration-dependent minority carrier lifetime in an In0.53Ga0.47As interdigitated lateral PIN photodiode model based on spin-on chemical fabrication methodology
View moreConsistency of quasi-static boundary value problems in electromagnetic modelling
View moreFinite Element Methods in Electrical Power Engineering, ABJ Reece and TW Preston, Oxford Science publications, Monographs in Electrical and Electronic Engineering, Oxford University Press, Oxford, 2000, 292 pp., '55 (hardback), ISBN 0-19-856504-6.
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