verified SJR 0,601 · Q2 • database Scopus / SJR & Web of Science indexed

Netherlands · Elsevier B.V.

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Journal of Electron Spectroscopy and Related Phenomena

Journal of Electron Spectroscopy and Related Phenomena is a journal indexed in SJR in Electronic, Optical and Magnetic Materials and Atomic and Molecular Physics, and Optics with an H index of 106. It has an SJR impact factor of 0,601 and it has a best quartile of Q2. It is published in English. It has an SJR impact factor of 0,601.

ISSN: 0368-2048

Publisher: Elsevier B.V.

Category: Electronic, Optical and Magnetic Materials

Indexation: verifiedScopus / SJR verifiedWeb of Science

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schedule CountryOfPapers database fields

SJR Impact Factor trending_up

0,601 Q2

H-index 106

Acceptance rate pie_chart

25% Selective

Source Acceptance_Rate

Time to publication hourglass_top

NPD

Field NPD

Publication cost (APC) payments

NPD Subscription

Non-OA path NPD

Metrics

Scimago and CountryOfPapers database fields

Scopus / SJR Web of Science

SJR Impact

0,601

H-index

106

Docs (year)

Docs 3y

194

Total refs

1584

Cites 3y

380

Citable 3y

192

Cites/Doc 2y

1.57

Ref/Doc

40.62

Immediate OA

—

Embargoed OA

NPD

Non OA / Submission

—

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Best articles by citations

Autoionization of acetylene studied by two-dimensional photoelectron spectroscopy

XPS study of vanadium-yttrium hydrates

Does the Friedel-Anderson model give a good account of the d levels of dilute transition metals in magnesium and aluminium alloys?

Development and performance of a profilometer for measurement of mirror surface figure

Determination of partial single differential electron ionization cross sections of H2

Cu 2p X-ray absorption and Cu 2p-3d resonant photoemission spectroscopy of LaCuO3

Core level study of NbC(100) and NbN(100)

Copper L3-M4,5M4,5 Auger and Auger satellite structures in polycrystalline Cu50Pd50 alloy

Cation spectroscopy of aromatic-argon van der Waals complexes by ZEKE photoelectron spectra

Calibration and spectroscopy with a laterally-d graded multilayer interference mirror

Branching ratios of the circular dichroism at rare earth L23 edges

Biological microscopy and soft X-ray optics at Stony Brook

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Binding energies of alkali metal halide cluster ions: calculated by electrostatic models and measured by the kinetic method

(e,2e) Spectroscopy of solids with improved energy resolution

Auger electron spectroscopy study of the electronic structure of porous silicon-metal interfaces

Auger and autoionisation spectra of rare earths

Assignment of fluorine sites in (Tl0.5Pb0.5)Sr1.6Ba0.4Ca2Cu3Oy/Fx

Angular resolved autoionization spectroscopy of N2 on Ni(110)

Angular distributionsof p-wave electrons from Mg3pns autoionizing states

Analysis of a quadratic algorithm for the angular-resolved XPS method for depth profiling

AES: energy calibration of electron spectrometers. Ill - General calibration rules

AES of bulk insulators -control and characterisation of the surface charge

Absorption and luminescence spectra of amorphous CdI2 thin films

A new method for polarization analysis in the VUV

FAQs

Journal of Electron Spectroscopy and Related Phenomena has an SJR of 0,601 (best quartile Q2) in the CountryOfPapers database.

Immediate OA APC is not available (NPD).

The acceptance rate recorded for Journal of Electron Spectroscopy and Related Phenomena is 25%.

Journal of Electron Spectroscopy and Related Phenomena

Metrics

Name good journals. Call out predatory ones.

Researcher reviews

Best articles by citations

FAQs

What is the SJR of Journal of Electron Spectroscopy and Related Phenomena?

What is the APC / publication cost?

What is the acceptance rate?