verified SJR 0,316 · Q3 • database Scopus / SJR & Web of Science indexed

Netherlands · Springer Netherlands

workspace_premium Q3 — Electrical and Electronic Engineering lock_open Open Access

Journal of Electronic Testing

Journal of Electronic Testing is among the journals recognized for Editorial Excellence. Editor-in-Chief Dr. Vishwani Agrawal performed in the top 10% of qualifying journals* based on data collected from the Journal Author Satisfaction survey. Click here for more information: htt...

ISSN: 0923-8174

Publisher: Springer Netherlands

Category: Electrical and Electronic Engineering

Indexation: verifiedScopus / SJR verifiedWeb of Science

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schedule CountryOfPapers database fields

SJR Impact Factor trending_up

0,316 Q3

H-index 38

Acceptance rate pie_chart

34%

Source Acceptance_Rate

Time to publication hourglass_top

NPD

Field NPD

Publication cost (APC) payments

2.290 € Open Access

Non-OA path 0 €

Metrics

Scimago and CountryOfPapers database fields

Scopus / SJR Web of Science

SJR Impact

0,316

H-index

Docs (year)

Docs 3y

154

Total refs

1834

Cites 3y

213

Citable 3y

133

Cites/Doc 2y

1.37

Ref/Doc

31.08

Immediate OA

2290 €

Embargoed OA

NPD

Non OA / Submission

0 €

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Best articles by citations

Modeling Remapping Based Fault Tolerance Techniques for Chip Multiprocessor Cache with Design Space Exploration

Trojan Detection Test for Clockless Circuits

Testability Trade-Offs for BIST Data Paths

Test Technology Technical Council Newsletter

Scan Latch Design for Test Applications

Scalable Delay Fault BIST for Use with Low-Cost ATE

Reliability Model and Sensitivity Analysis for General Electronic Systems with Failure Types based on Non-identical Correlated Components

Optimal Selection of Tests for Fault Diagnosis in Multi-Path System with Time-delay

On Using Approximate Computing to Build an Error Detection Scheme for Arithmetic Circuits

Multi-Threaded Mitigation of Radiation-Induced Soft Errors in Bare-Metal Embedded Systems

A Design for Testability Scheme for CMOS LC-Tank Voltage Controlled Oscillators

Improved Pseudo-Random Fault Coverage Through Inversions: a Study on Test Point Architectures

SHOW MORE ARTICLES

High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors

Editorial

Analysis of Test Application Time for Test Data Compression Methods Based on Compression Codes

Analog Switches in Programmable Analog Devices: Quiescent Defective Behaviours

An Efficient Test Set Construction Scheme for Multiple Missing-Gate Faults in Reversible Circuits

An Efficient Accuracy Reconfigurable CLA Adder Designs Using Complementary Logic

A Low-Cost At-Speed BIST Architecture for Embedded Processor and SRAM Cores

FAQs

Journal of Electronic Testing has an SJR of 0,316 (best quartile Q3) in the CountryOfPapers database.

Immediate OA APC is 2290 EUR. Non-OA / submission fee is 0 EUR.

The acceptance rate recorded for Journal of Electronic Testing is 34%.

Journal of Electronic Testing

Metrics

Name good journals. Call out predatory ones.

Researcher reviews

Best articles by citations

FAQs

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What is the APC / publication cost?

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