Default: Materials Science and Engineering: R: Reports

ISSN: 0927-796X

Journal Home

Journal Guideline

Materials Science and Engineering: R: Reports Q1 Unclaimed

Elsevier BV Netherlands
Unfortunately this journal has not been claimed yet. For this reason, some information may be unavailable.

Materials Science and Engineering: R: Reports is a journal indexed in SJR in Materials Science (miscellaneous) and Condensed Matter Physics with an H index of 159. It has an SJR impact factor of 6,842 and it has a best quartile of Q1. It is published in English. It has an SJR impact factor of 6,842.

Type: Journal

Type of Copyright:

Languages: English

Open Access Policy: Open Choice

Type of publications:

Publication frecuency: -


Materials Science and Engineering: R: Reports


SJR Impact factor


H Index


Total Docs (Last Year)


Total Docs (3 years)


Total Refs


Total Cites (3 years)


Citable Docs (3 years)


Cites/Doc (2 years)




No comments ... Be the first to comment!

Best articles by citations

Wafer direct bonding: tailoring adhesion between brittle materials

View more

Organic polymeric and small molecular electron acceptors for organic solar cells

View more

Nanometric superlattices: non-lithographic fabrication, materials, and prospects

View more

Nonequilibrium point defects and diffusion in silicon

View more

Solid state amorphization in metal/Si systems

View more

MBE growth of artificially-layered magnetic-metal structures on semiconductors and insulators

View more

Self-organized nanopatterning of silicon surfaces by ion beam sputtering

View more

Charge transfer and storage in nanostructures

View more

Surface induced self assembly in thin polymer films

View more

Threshold voltage shifting for memory and tuning in printed transistor circuits

View more

Guide to references on III-V semiconductor chemical etching

View more

Boron diffusion in silicon: the anomalies and control by point defect engineering

View more

Materials engineering for surface-confined flame retardancy

View more

Recent developments in the preparation and properties of nanometer-size spherical and platelet-shaped particles and composite particles

View more

CVD diamond films: nucleation and growth

View more

Computational electronics

View more

Charged point defects in semiconductors

View more

Silicides for integrated circuits: TiSi2 CoSi2

View more

Recent progress in field emitter array development for high performance applications

View more

Fabrication and quantum properties of nanostructured silicon

View more

Second-order nonlinear optical properties of chiral materials

View more

Phonon-mediated particle detectors: physics and materials

View more

Nanoscale characterization of semiconductor materials and devices using scanning probe techniques

View more

Interfacial interaction between low-energy surfaces

View more