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verified SJR 0,505 · Q2 • database Scopus / SJR & Web of Science indexed
Optik
Germany · Elsevier GmbH
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Optik

Optik is a journal indexed in SJR in Electronic, Optical and Magnetic Materials and Atomic and Molecular Physics, and Optics with an H index of 114. It has a price of 1620 €. It has an SJR impact factor of 0,505 and it has a best quartile of Q2. It is published in English. It has an SJR impact factor of 0,505.

ISSN: 0030-4026
Publisher: Elsevier GmbH
Category: Electronic, Optical and Magnetic Materials
Indexation: verifiedScopus / SJR verifiedWeb of Science
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schedule CountryOfPapers database fields
SJR Impact Factor trending_up
0,505 Q2
H-index 114
Acceptance rate pie_chart
26% Selective
Source Acceptance_Rate
Time to publication hourglass_top
NPD
Field NPD
Publication cost (APC) payments
1.620 € Subscription
Non-OA path 0 €

Metrics

Scimago and CountryOfPapers database fields

Scopus / SJR Web of Science

SJR Impact

0,505

H-index

114

Docs (year)

406

Docs 3y

4675

Total refs

18685

Cites 3y

17381

Citable 3y

4670

Cites/Doc 2y

3.81

Ref/Doc

46.02

Immediate OA

1620 €

Embargoed OA

NPD

Non OA / Submission

0 €

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Best articles by citations

Accurate p/2-phase shifting setup for a stabilized interference pattern of light fringes

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Wideband terahertz anisotropy metamaterial based on metallic strip-split ring array

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Cross calibration of GF-4 visible and near-infrared sensor with CE-3 VNIS sensor based on lunar

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Copper selenide films via screen printing and sintering technique for semiconductor device applications: Synthesis and characterization

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Control chaos in fractional-order system via two kinds of intermittent schemes

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Comparative statistical analysis of phase profiles of a pseudo random phase plate with Kolmogorov phase screens

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Color balloon snakes for face segmentation

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Cardinality enrichment of flexible cross correlation (FCC) code for SAC-OCDMA system by alleviation interference scheme (AIS)

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Bright, dark and Gaussons optical solutions for fourth-order Schrodinger equations with cubic-quintic and logarithmic nonlinearities

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Auto-classification for confocal back-scattering micro-spectrum at single-cell scale using principal component analysis

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Attitude scheduling and verification for dynamic imaging of agile satellites

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Analysis of Fraunhofer diffraction patterns' entropy based on apertures shaped as national borders

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A note on the two papers of Mostafa M. A. Khater et al. and Dianchen Lu et al. [Optik, 158 (2018) 434-450 and 164 (2018) 54-64]

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