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ISSN: 0586-5581

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Scanning Electron Microscopy Q4 Unclaimed

Scanning Microscopy International United States
Unfortunately this journal has not been claimed yet. For this reason, some information may be unavailable.

Scanning Electron Microscopy is a journal indexed in SJR in Biophysics and Control and Systems Engineering with an H index of 0. It has an SJR impact factor of 0,101 and it has a best quartile of Q4. It is published in English. It has an SJR impact factor of 0,101.

Type: Journal

Type of Copyright:

Languages: English

Open Access Policy:

Type of publications:

Publication frecuency: -

Categories: Biophysics (Q4) Control and Systems Engineering (Q4)
Price

- €

Inmediate OA

NPD

Embargoed OA

- €

Non OA

Metrics

Scanning Electron Microscopy

0,101

SJR Impact factor

0

H Index

0

Total Docs (Last Year)

17

Total Docs (3 years)

0

Total Refs

0

Total Cites (3 years)

17

Citable Docs (3 years)

0

Cites/Doc (2 years)

0.0

Ref/Doc

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MCB Molecular and Cellular Biomechanics Q4
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What is the impact factor of Scanning Electron Microscopy?

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