ISSN: 0040-1706

Journal Home

Journal Guideline

Technometrics Q1 Unclaimed

Taylor and Francis Ltd. United Kingdom

Unfortunately this journal has not been claimed yet. For this reason, some information may be unavailable.

Technometrics is a journal indexed in SJR in Modeling and Simulation and Statistics and Probability with an H index of 96. It has a price of 2500 €. It has an SJR impact factor of 1,408 and it has a best quartile of Q1. It is published in English. It has an SJR impact factor of 1,408.

Type: Journal

Type of Copyright:

Languages: English

Open Access Policy:

Type of publications:

Publication frecuency: -

Categories: Applied Mathematics (Q1) Modeling and Simulation (Q1) Statistics and Probability (Q1)

Price

2500 €

Inmediate OA

NPD

Embargoed OA

0 €

Non OA

Metrics

1,408

SJR Impact factor

96

H Index

70

Total Docs (Last Year)

130

Total Docs (3 years)

3272

Total Refs

491

Total Cites (3 years)

127

Citable Docs (3 years)

3.42

Cites/Doc (2 years)

46.74

Ref/Doc

Comments

No comments ... Be the first to comment!

Publication speed *

Review quality *

Edition and editorial team *

Institutional email or ORCID *

* The email or ORCID field is only to validate the authenticity of the comment, the identity will not be public. .

Other journals with similar parameters

Structural Equation Modeling Q1
npj Computational Materials Q1
International Journal of Robotics Research Q1
European Journal of Operational Research Q1
Energy Q1

Compare this journals

Aims and Scope

Best articles by citations

Score Tests for the Single Index Model

Early Detection of Reliability Problems Using Information From Warranty Databases

Constrained Maximin Designs for Computer Experiments

Probability: The Science of Uncertainty

Analysis of Messy Data Volume III: Analysis of Covariance

Detecting Mines in Minefields With Linear Characteristics

Discussion of the Papers of Messrs. Anscombe and Daniel

Modern Statistics for Engineering and Quality Improvement

Local Influence of Predictors in Multiple Linear Regression

Group Testing in the Presence of Test Error; An Extension of the Dorfman Procedure

Bayesian Statistical Modelling

Confidence Limits for Stress-Strength Models With Explanatory Variables

SHOW MORE ARTICLES

Confidence Regions Around the Ridge of Optimal Response on Fitted Second-Order Response Surfaces

Analysis of Time Series Structure SSA and Related Techniques

Wavelet Methods for Time Series Analysis

Using Angles to Identify Concentrated Multivariate Outliers

Eliminating Suboptimal Local Minimizers in Nonlinear Parameter Estimation

Statistical Challenges Facing Early Outbreak Detection in Biosurveillance

Statistical Models in S

Statistics: The Exploration and Analysis of Data

A Profile-Based Approach to Parametric Sensitivity Analysis of Nonlinear Regression Models

Credit in Acceptance Sampling on Attributes

Identifying Productivity Drivers by Modeling Work Units Using Partial Data

Wavelet-Based Estimation for Seasonal Long-Memory Processes