verified SJR 0,234 · Q3 • database Scopus / SJR & Web of Science indexed

South Korea · The Korean Institute of Elec...

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Transactions on Electrical and Electronic Materials

Transactions on Electrical and Electronic Materials is a journal indexed in SJR in Electronic, Optical and Magnetic Materials and Electrical and Electronic Engineering with an H index of 33. It has a price of 2190 €. It has an SJR impact factor of 0,234 and it has a best quartile of Q3. It is published in English. It has an SJR impact factor of 0,234.

ISSN: 1229-7607

Publisher: The Korean Institute of Electrical and Electronic Material Engineers

Category: Electronic, Optical and Magnetic Materials

Indexation: verifiedScopus / SJR verifiedWeb of Science

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schedule CountryOfPapers database fields

SJR Impact Factor trending_up

0,234 Q3

H-index 33

Acceptance rate pie_chart

39%

Source Acceptance_Rate

Time to publication hourglass_top

NPD

Field NPD

Publication cost (APC) payments

2.190 € Open Access

Non-OA path 0 €

Metrics

Scimago and CountryOfPapers database fields

Scopus / SJR Web of Science

SJR Impact

0,234

H-index

Docs (year)

Docs 3y

248

Total refs

3342

Cites 3y

605

Citable 3y

248

Cites/Doc 2y

2.42

Ref/Doc

39.79

Immediate OA

2190 €

Embargoed OA

NPD

Non OA / Submission

0 €

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Best articles by citations

CaxSr2-xSiO4:Eu2+Green-emitting Nano Phosphor for Ultraviolet Light Emitting Diodes

Voltage Enhancement of ZnO Oxide Varistors for Various Y2O3Doping Compositions

Demand Aware Voltage Control of Hybrid Renewable Energy Tied Uneven Multi-level Smart Inverter

Degradation Characteristics of Pr/Co/Cr/Er Co-doped Zinc Oxide Varistors by Impulse Current Stress

Current-Voltage Characterization of Silicon Quantum Dot Solar Cells

Controllable Pretilt Angles for Liquid Crystal Molecules using a Rubbing Treated Mixture Layer

Comparison of Optical Properties of Ga-doped and Ag-doped ZnO Nanowire Measured at Low Temperature

Clamping Voltage Characteristics and Accelerated Aging Behavior of CoCrTb-doped Zn/Pr-based Varistors with Sintering Temperature

Characterization of Graphite Oxide Reduced by Thermal and/or Chemical Treatments

Characterization of Conduction Mechanism in Cu Schottky Contacts to p-type Ge

Characterization of a Crystallized ZnO/CuSn/ZnO Multilayer Film Deposited with Low Temperature Magnetron Sputtering

Characteristics of Photoresist-derived Carbon Nanofibers for Li-ion Full Cell Electrode

SHOW MORE ARTICLES

Changes in the Optogalvanic Signal Amplitude in a Hollow Cathode Discharge

A 10-bit Current-steering DAC in 0.35-¬µm CMOS Process

Black-white Reflective Liquid Crystal Display Prepared with Two Color Reflective Layers

Bipolar Charge Transport Model Optimized to Simulate the Space Charge Build-Up Within the Bi-Dielectric System

Atmospheric Plasma Treatment on Copper for Organic Cleaning in Copper Electroplating Process: Towards Microelectronic Packaging Industry

Antibacterial Properties of TiAgN and ZrAgN Thin Film Coated by Physical Vapor Deposition for Medical Applications

Analysis of Novel Helmholtz-inductively Coupled Plasma Source and Its Application for Nano-Scale MOSFETs

Analysis of Characteristics of DLC Coating Thin Film in Tungsten Carbide for Production of Medical Thermal-Infrared Lenses

A Study of the Properties of Optically Induced Layers in Semiconductors Aided by the Reflection of Optically Controlled Microwave Pulses

A Study of the Change of Hall Effect as a Function of the V/III Ratio in n-GaAs compound Semiconductors

A Light-induced Threshold Voltage Instability Based on a Negative-U Center in a-IGZO TFTs with Different Oxygen Flow Rates

A Facile Method for Micropatterning of Gold Nanoparticles Immobilized on UV Cross-linked Polymer Thin Films

FAQs

Transactions on Electrical and Electronic Materials has an SJR of 0,234 (best quartile Q3) in the CountryOfPapers database.

Immediate OA APC is 2190 EUR. Non-OA / submission fee is 0 EUR.

The acceptance rate recorded for Transactions on Electrical and Electronic Materials is 39%.

Transactions on Electrical and Electronic Materials

Metrics

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Researcher reviews

Best articles by citations

FAQs

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