Default: Advances in Imaging and Electron Physics

ISSN: 1076-5670

Journal Home

Journal Guideline

Advances in Imaging and Electron Physics Q4 Unclaimed

Academic Press Inc. United States
Unfortunately this journal has not been claimed yet. For this reason, some information may be unavailable.

Advances in Imaging and Electron Physics is a book series indexed in SJR in Condensed Matter Physics and Electrical and Electronic Engineering with an H index of 41. It has an SJR impact factor of 0,113 and it has a best quartile of Q4. It is published in English. It has an SJR impact factor of 0,113.

Type: Book series

Type of Copyright:

Languages: English

Open Access Policy:

Type of publications:

Publication frecuency: -

Metrics

Advances in Imaging and Electron Physics

0,113

SJR Impact factor

41

H Index

41

Total Docs (Last Year)

95

Total Docs (3 years)

901

Total Refs

22

Total Cites (3 years)

21

Citable Docs (3 years)

0.18

Cites/Doc (2 years)

21.98

Ref/Doc

Comments

No comments ... Be the first to comment!



Best articles by citations

The Aharonov-Bohm effect - A second opinion

View more

Digital Image Processing Technology for Scanning Electron Microscopy

View more

TSEM

View more

Dyadic warped wavelets

View more

Preface

View more

The Finite-Difference Method (FDM)

View more

The Finite-Element Method (FEM)

View more

Atom probe-based correlative microscopy

View more

Non-stationary thermal field emission

View more

Modern tools for weyl-heisenberg (gabor) frame theory

View more

Recent developments in scanning electron microscope design

View more

Second-generation image coding

View more
SHOW MORE ARTICLES

Theory of ranked-order filters with applications to feature extraction and interpretive transforms

View more

Recent developments in stack filtering and smoothing

View more

Dynamics of Particles and Fields

View more

The Boundary Element Method

View more

Improved laser scanning fluorescence microscopy by multiphoton excitation

View more

Introduction to the Fractional Fourier Transform and Its Applications

View more

Analysis and fringe field scaling of a legacy set of electrostatic deflector aberration formulas

View more

Well-composed sets

View more

Partially coherent quantum degenerate electron matter waves

View more

Preface

View more

Hybrid Methods

View more

Inaccuracies in atom probe measurements of semiconductor composition

View more

FAQS