ISSN: 0162-8828

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IEEE Transactions on Pattern Analysis and Machine Intelligence Q1 Unclaimed

IEEE Computer Society United States

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IEEE Transactions on Pattern Analysis and Machine Intelligence is a journal indexed in SJR in Software and Applied Mathematics with an H index of 344. It has an SJR impact factor of 7,536 and it has a best quartile of Q1. It is published in English.

Type: Journal

Type of Copyright:

Languages: English

Open Access Policy:

Type of publications:

Publication frecuency: -

Categories: Applied Mathematics (Q1) Artificial Intelligence (Q1) Computational Theory and Mathematics (Q1) Computer Vision and Pattern Recognition (Q1) Software (Q1)

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Metrics

IEEE Transactions on Pattern Analysis and Machine Intelligence

7,536

SJR Impact factor

344

H Index

218

Total Docs (Last Year)

626

Total Docs (3 years)

11845

Total Refs

15167

Total Cites (3 years)

601

Citable Docs (3 years)

26,69

Cites/Doc (2 years)

54,33

Ref/Doc

Aims and Scope

Other journals with similar parameters

Journal of Statistical Software Q1
Foundations and Trends in Machine Learning Q1
IEEE Transactions on Cybernetics Q1
International Journal of Computer Vision Q1
IEEE Transactions on Evolutionary Computation Q1

Best articles

A condition number for point matching with application to registration and postregistration error estimation

A general discrete contour model in two, three, and four dimensions for topology-adaptive multichannel segmentation

A general model for finite-sample effects in training and testing of competing classifiers

A multiresolution approach for shape shading coupling deterministic and stochastic optimization

A new pattern representation scheme using data compression

A statistical model for contours in images

A study of methods of choosing the smoothing parameter in image restoration by regularization

A Two-Stage Cross Correlation Approach to Template Matching

A Visual-Attention Model Using Earth Mover's Distance-Based Saliency Measurement and Nonlinear Feature Combination

Affine invariant features from the trace transform

Algorithms for matching 3d line sets

Alignment using distributions of local geometric properties

SHOW MORE ARTICLES

Analysis of 3-D rotation fitting

ARMA Modeling of Time Series

Bagging for path-based clustering

Bidirectional Texture Function Modeling: A State of the Art Survey

Blind Separation of Superimposed Moving Images Using Image Statistics

Bregman Divergences and Surrogates for Learning

Camera self-calibration from unknown planar structures enforcing the multiview constraints between collineations

Chain Coding with a Hexagonal Lattice

Class conditional density estimation using mixtures with constrained component sharing

Computational surface flattening: a voxel-based approach

Computing minimal distances on polyhedral surfaces

Correlation filter: an accurate approach to detect and locate low contrast character strings in complex table environment

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