Journal of Research of the National Institute of Standards and Technology Q3
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Journal of Research of the National Institute of Standards and Technology is a journal indexed in SJR in Engineering (miscellaneous) with an H index of 65. It is an CC BY Journal with a Single blind Peer Review review system The scope of the journal is focused on physical science, engineering, applied mathematics, biotechnology, information technology, metrology. It has an SJR impact factor of 0,251 and it has a best quartile of Q3. It is published in English. It has an SJR impact factor of 0,251.
Type: Journal
Type of Copyright: CC BY
Languages: English
Open Access Policy: Open Access
Type of publications:
Publication frecuency: -



- €
Inmediate OANPD
Embargoed OA- €
Non OAMetrics
0,251
SJR Impact factor65
H Index0
Total Docs (Last Year)92
Total Docs (3 years)0
Total Refs142
Total Cites (3 years)92
Citable Docs (3 years)1.67
Cites/Doc (2 years)0.0
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Aims and Scope
Best articles by citations
Biophotonic tools in cell and tissue diagnostics
View moreWavelengths and energy levels of neutral Kr-84 and level shifts in all Kr even isotopes
View moreA general waveguide circuit theory
View moreMeasurement tools for the immersive visualization environment: Steps toward the virtual laboratory
View moreExternal-field shifts of the 199-Hg(+) optical frequency standard
View moreSynthesis of Polymerizable Cyclodextrin Derivatives for Use in Adhesion-Promoting Monomer Formulations
View moreStiffening of the Extrapulmonary Arteries From Rats in Chronic Hypoxic Pulmonary Hypertension
View moreOn-demand generation of a formaldehyde-in-air standard
View moreMetrology and standards needs for some categories of medical devices
View moreEffect of power line interference on microphone calibration measurements made at or near harmonics of the power line frequency
View moreThe Visible Cement Data Set
View moreUncertainty due to finite resolution measurements
View moreWill future measurement needs of the semiconductor industry be met?
View moreMethods for Quantifying and Characterizing Errors in Pixel-Based 3D Rendering
View moreSimple Thermal-Efficiency Model for CMOS-Microhotplate Design
View moreHe-4 thermophysical properties: New ab initio calculations
View moreFirst-Principles Calculation of the Third Virial Coefficient of Helium
View moreOn the asymptotic behavior of the Fourier coefficients of Mathieu functions
View moreComparison of the NIST and BIPM Standards for Air Kerma in Medium-Energy X-Rays
View morePriorities for Standards and Measurements to Accelerate Innovations in Nano-Electrotechnologies: Analysis of the NIST-Energetics-IEC TC 113 Survey
View moreExtracting electron densities in N-type GaAs from Raman spectra: Theory
View moreOptimal Facility-Location
View moreErratum: External-Field Shifts of the 199Hg+ Optical Frequency Standard
View moreA compendium on the NIST radionuclidic assays of the massic activity of Ni-63 and Fe-55 solutions used for an international intercomparison of liquid scintillation spectrometry techniques
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