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Surface Topography: Metrology and Properties Q2 Unclaimed

IOP Publishing Ltd. United Kingdom

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Surface Topography: Metrology and Properties is a journal indexed in SJR in Materials Chemistry and Surfaces, Coatings and Films with an H index of 41. It has an SJR impact factor of 0,476 and it has a best quartile of Q2. It has an SJR impact factor of 0,476.

Type: Journal

Type of Copyright:

Languages:

Open Access Policy:

Type of publications:

Publication frecuency: -

Categories: Instrumentation (Q2) Materials Chemistry (Q2) Surfaces, Coatings and Films (Q2) Process Chemistry and Technology (Q3)

Price

- €

Inmediate OA

NPD

Embargoed OA

- €

Non OA

Metrics

Surface Topography: Metrology and Properties

0,476

SJR Impact factor

41

H Index

123

Total Docs (Last Year)

504

Total Docs (3 years)

4908

Total Refs

1510

Total Cites (3 years)

502

Citable Docs (3 years)

2.79

Cites/Doc (2 years)

39.9

Ref/Doc

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