Default: Ultramicroscopy

ISSN: 0304-3991

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Ultramicroscopy Q1 Unclaimed

Elsevier Netherlands
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Ultramicroscopy is a journal indexed in SJR in Electronic, Optical and Magnetic Materials and Atomic and Molecular Physics, and Optics with an H index of 131. It has a price of 2745 €. It has an SJR impact factor of 0,794 and it has a best quartile of Q1. It is published in English. It has an SJR impact factor of 0,794.

Ultramicroscopy focuses its scope in these topics and keywords: electron, determination, stem, force, image, phase, resolution, orientation, microscope, digital, ...

Type: Journal

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Languages: English

Open Access Policy:

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Publication frecuency: -




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Citable Docs (3 years)


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Aims and Scope

electron, determination, stem, force, image, phase, resolution, orientation, microscope, digital, detectionbiassed, dna, echord, electronsis, field, idr, imaging, diffraction, approach, d, cscorrected, crystalline, cryoembasic, contrast, cleavage, channeling, bromide, bright, atomic, assumption,

Best articles by citations

Simulation of TEM images considering phonon and electronic excitations

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Indirect EELS imaging reaching atomic scale -CaO planar faults in CaTiO3

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The dependence of the symmetry (spin) forbidden photoluminescence of C60 molecules on their proximity to metal

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The Sayre equation in electron crystallography

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Structure determination of tubular crystals of membrane proteins. III. Solvent flattening

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Ion-beam thinning An atomistic view by molecular dynamics simulations

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Simultaneous reflection and transmission modes near-field scanning optical microscope

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Optical near-field induced current microscopy

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The wave-mixing near field optics amplifier: a theoretical feasibility study for non-linear NFO experiments in biology, chemistry and materials science

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Direct structure reconstruction in HRTEM

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CART: a controlled algebraic reconstruction technique for electron microscope tomography of embedded, sectioned specimen

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Optimum condition of convergent beam illumination for observation of local structure by high resolution transmission electron microscopy

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Quantitative interpretation of HRTEM images using multivariate statistics: the case of the ( gamma, gamma')-interface in a Ni base superalloy

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Proposal of alignment-independent classification of electron microscopic images with helical symmetry and its application to reconstituted thin filaments of skeletal muscle

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Quantitative surface chemical mapping with Auger and backscattered electron signals

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Simulation of electron holographic contour maps of linear charged dislocations

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Formation of tungsten silicide on an STM tip during atom manipulation

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Development of near-field optic/atomic-force microscope for biological materials in aqueous solutions

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Computer simulation and object reconstruction in low-energy off-axis electron holography

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Preliminary investigation of two methods for the automatic handling of multivariate maps in microanalysis

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Fabrication and characterization of optoelectronic near-field probes based on an SFM cantilever design

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Field emission of carbon fibers

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Ab initio study on interaction between carbon atom and Si(100) surface in strong electric fields

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Experimental characterisation of CCD cameras for HREM at 300kV

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