ISSN: 0304-3991

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Ultramicroscopy Q1 Unclaimed

Elsevier Netherlands

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Ultramicroscopy is a journal indexed in SJR in Electronic, Optical and Magnetic Materials and Atomic and Molecular Physics, and Optics with an H index of 131. It has a price of 2745 €. It has an SJR impact factor of 0,794 and it has a best quartile of Q1. It is published in English. It has an SJR impact factor of 0,794.

Ultramicroscopy focuses its scope in these topics and keywords: electron, determination, stem, force, image, phase, resolution, orientation, microscope, digital, ...

Type: Journal

Type of Copyright:

Languages: English

Open Access Policy:

Type of publications:

Publication frecuency: -

Categories: Atomic and Molecular Physics, and Optics (Q1) Electronic, Optical and Magnetic Materials (Q1) Instrumentation (Q1)

Price

2745 €

Inmediate OA

NPD

Embargoed OA

0 €

Non OA

Metrics

0,794

SJR Impact factor

131

H Index

110

Total Docs (Last Year)

508

Total Docs (3 years)

4592

Total Refs

1211

Total Cites (3 years)

505

Citable Docs (3 years)

2.31

Cites/Doc (2 years)

41.75

Ref/Doc

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Aims and Scope

Best articles by citations

Simulation of TEM images considering phonon and electronic excitations

Indirect EELS imaging reaching atomic scale -CaO planar faults in CaTiO3

The dependence of the symmetry (spin) forbidden photoluminescence of C60 molecules on their proximity to metal

The Sayre equation in electron crystallography

Structure determination of tubular crystals of membrane proteins. III. Solvent flattening

Ion-beam thinning An atomistic view by molecular dynamics simulations

Simultaneous reflection and transmission modes near-field scanning optical microscope

Optical near-field induced current microscopy

The wave-mixing near field optics amplifier: a theoretical feasibility study for non-linear NFO experiments in biology, chemistry and materials science

Direct structure reconstruction in HRTEM

CART: a controlled algebraic reconstruction technique for electron microscope tomography of embedded, sectioned specimen

Optimum condition of convergent beam illumination for observation of local structure by high resolution transmission electron microscopy

SHOW MORE ARTICLES

Quantitative interpretation of HRTEM images using multivariate statistics: the case of the ( gamma, gamma')-interface in a Ni base superalloy

Proposal of alignment-independent classification of electron microscopic images with helical symmetry and its application to reconstituted thin filaments of skeletal muscle

Quantitative surface chemical mapping with Auger and backscattered electron signals

Simulation of electron holographic contour maps of linear charged dislocations

Formation of tungsten silicide on an STM tip during atom manipulation

Development of near-field optic/atomic-force microscope for biological materials in aqueous solutions

Computer simulation and object reconstruction in low-energy off-axis electron holography

Preliminary investigation of two methods for the automatic handling of multivariate maps in microanalysis

Fabrication and characterization of optoelectronic near-field probes based on an SFM cantilever design

Field emission of carbon fibers

Ab initio study on interaction between carbon atom and Si(100) surface in strong electric fields

Experimental characterisation of CCD cameras for HREM at 300kV