Default: Ultramicroscopy

ISSN: 0304-3991

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Ultramicroscopy Q1 Unclaimed

Elsevier B.V. Netherlands
Unfortunately this journal has not been claimed yet. For this reason, some information may be unavailable.

Ultramicroscopy is a journal indexed in SJR in Electronic, Optical and Magnetic Materials and Atomic and Molecular Physics, and Optics with an H index of 137. It has a price of 2745 €. It has an SJR impact factor of 0,78 and it has a best quartile of Q1. It is published in English. It has an SJR impact factor of 0,78.

Ultramicroscopy focuses its scope in these topics and keywords: electron, resolution, determination, phase, image, microscope, force, stem, orientation, eel, ...

Type: Journal

Type of Copyright:

Languages: English

Open Access Policy:

Type of publications:

Publication frecuency: -

Metrics

Ultramicroscopy

0,78

SJR Impact factor

137

H Index

130

Total Docs (Last Year)

422

Total Docs (3 years)

5154

Total Refs

936

Total Cites (3 years)

420

Citable Docs (3 years)

2.09

Cites/Doc (2 years)

39.65

Ref/Doc

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Aims and Scope


electron, resolution, determination, phase, image, microscope, force, stem, orientation, eel, echord, detectionbiassed, holograms, idr, imaging, inline, k, dna, digital, diffraction, assumption, atomic, bright, cleavage, contrast, cryoembasic, cryomicroscopywhen, crystalline, cscorrected, d,



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The dependence of the symmetry (spin) forbidden photoluminescence of C60 molecules on their proximity to metal

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The Sayre equation in electron crystallography

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Structure determination of tubular crystals of membrane proteins. III. Solvent flattening

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Ion-beam thinning An atomistic view by molecular dynamics simulations

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Simultaneous reflection and transmission modes near-field scanning optical microscope

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Optical near-field induced current microscopy

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The wave-mixing near field optics amplifier: a theoretical feasibility study for non-linear NFO experiments in biology, chemistry and materials science

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Direct structure reconstruction in HRTEM

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CART: a controlled algebraic reconstruction technique for electron microscope tomography of embedded, sectioned specimen

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Optimum condition of convergent beam illumination for observation of local structure by high resolution transmission electron microscopy

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