verified SJR 0,725 · Q1 • database Scopus / SJR & Web of Science indexed

United States · Institute of Electrical and...

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IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems is a journal indexed in SJR in Software and Electrical and Electronic Engineering with an H index of 136. It has an SJR impact factor of 0,725 and it has a best quartile of Q1. It is published in English. It has an SJR impact factor of 0,725.

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems focuses its scope in these topics and keywords: circuit, based, approach, hardware, placement, algorithm, optimal, trees, style, test, ...

ISSN: 0278-0070

Publisher: Institute of Electrical and Electronics Engineers Inc.

Category: Software

Indexation: verifiedScopus / SJR verifiedWeb of Science

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schedule CountryOfPapers database fields

SJR Impact Factor trending_up

0,725 Q1

H-index 136

Acceptance rate pie_chart

23% Selective

Source Acceptance_Rate

Time to publication hourglass_top

NPD

Field NPD

Publication cost (APC) payments

NPD Subscription

Non-OA path NPD

Metrics

Scimago and CountryOfPapers database fields

Scopus / SJR Web of Science

SJR Impact

0,725

H-index

136

Docs (year)

534

Docs 3y

1085

Total refs

19597

Cites 3y

3762

Citable 3y

1084

Cites/Doc 2y

3.4

Ref/Doc

36.7

Immediate OA

—

Embargoed OA

NPD

Non OA / Submission

—

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Best articles by citations

A methodology for optimal repeater insertion in pipelined interconnects

Wire-sizing optimization with inductance consideration using transmission-line model

Charge-based analytical model for the evaluation of power consumption in submicron CMOS buffers

Broadcasting test patterns to multiple circuits

Behavioral optimization using the manipulation of timing constraints

An interconnect energy model considering coupling effects

An improved branch and bound algorithm for exact bdd minimization

An application-level synthesis methodology for multidimensional embedded processing systems

Addressing useless test data in core-based system-on-a-chip test

A Polynomial Time-Optimal Diode Insertion/Routing Algorithm for Fixing Antenna Problem

A physics-based semiconductor noise model suitable for efficient numerical implementation

A parallel transparent BIST method for embedded memory arrays by tolerating redundant operations

SHOW MORE ARTICLES

A Parallel Adaptable Routing Algorithm and its Implementation on a Two-Dimensional Array Processor

"Comments on ""Handling soft modules in general nonslicing floorplan using Lagrangian relaxation"

A Library Compatible Driver Output Model forOn-Chip RLC Transmission Lines

A High-Efficiency Strongly Self-Checking Asynchronous Datapath

A Hardware Generator for SORN Arithmetic

A fast technique based on perfectly matched layers for the full-wave solution of 2-d dispersive microstrip lines

A fanout optimization algorithm based on the effort delay model

A discretization scheme that allows coarse grid-spacing in finite-difference process simulation

A Design-Time Method for Building Cost-Effective Run-Time Power Monitoring

A BIST scheme for RTL circuits based on symbolic testability analysis

A behavioral model of a 1.8-V flash A/D converter based on device parameters

2-D CA Variation With Asymmetric Neighborship for Pseudorandom Number Generation

FAQs

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems has an SJR of 0,725 (best quartile Q1) in the CountryOfPapers database.

Immediate OA APC is not available (NPD).

The acceptance rate recorded for IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems is 23%.

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Metrics

Name good journals. Call out predatory ones.

Researcher reviews

Best articles by citations

FAQs

What is the SJR of IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems?

What is the APC / publication cost?

What is the acceptance rate?