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IEEE Transactions on Device and Materials Reliability Q2 Unclaimed

Institute of Electrical and Electronics Engineers Inc. United States

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IEEE Transactions on Device and Materials Reliability is a journal indexed in SJR in Electronic, Optical and Magnetic Materials and Electrical and Electronic Engineering with an H index of 82. It has an SJR impact factor of 0,533 and it has a best quartile of Q2. It is published in English. It has an SJR impact factor of 0,533.

Type: Journal

Type of Copyright:

Languages: English

Open Access Policy:

Type of publications:

Publication frecuency: -

Categories: Electrical and Electronic Engineering (Q2) Electronic, Optical and Magnetic Materials (Q2) Safety, Risk, Reliability and Quality (Q2)

Price

- €

Inmediate OA

NPD

Embargoed OA

- €

Non OA

Metrics

IEEE Transactions on Device and Materials Reliability

0,533

SJR Impact factor

82

H Index

95

Total Docs (Last Year)

213

Total Docs (3 years)

2761

Total Refs

585

Total Cites (3 years)

209

Citable Docs (3 years)

2.73

Cites/Doc (2 years)

29.06

Ref/Doc

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