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SJR 0,533 · Q2
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Scopus / SJR & Web of Science indexed
United States · Institute of Electrical and...
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Q2 — Electronic, Optical and Magnetic Materials
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IEEE Transactions on Device and Materials Reliability
IEEE Transactions on Device and Materials Reliability is a journal indexed in SJR in Electronic, Optical and Magnetic Materials and Electrical and Electronic Engineering with an H index of 82. It has an SJR impact factor of 0,533 and it has a best quartile of Q2. It is published in English. It has an SJR impact factor of 0,533.
Publisher: Institute of Electrical and Electronics Engineers Inc.
Category: Electronic, Optical and Magnetic Materials
Indexation:
verifiedScopus / SJR
verifiedWeb of Science
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CountryOfPapers database fields
SJR Impact Factor
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0,533
Q2
H-index
82
Acceptance rate
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27%
Selective
Source
Acceptance_Rate
Time to publication
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NPD
Field
NPD
Publication cost (APC)
payments
NPD
Subscription
Non-OA path
NPD
Metrics
Scimago and CountryOfPapers database fields
Scopus / SJR
Web of Science
SJR Impact
0,533
H-index
82
Docs (year)
95
Docs 3y
213
Total refs
2761
Cites 3y
585
Citable 3y
209
Cites/Doc 2y
2.73
Ref/Doc
29.06
Immediate OA
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Embargoed OA
NPD
Non OA / Submission
—
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