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IEEE Transactions on Device and Materials Reliability Q2 Unclaimed

Institute of Electrical and Electronics Engineers Inc. United States

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IEEE Transactions on Device and Materials Reliability is a journal indexed in SJR in Electronic, Optical and Magnetic Materials and Electrical and Electronic Engineering with an H index of 79. It has an SJR impact factor of 0,436 and it has a best quartile of Q2. It is published in English. It has an SJR impact factor of 0,436.

Type: Journal

Type of Copyright:

Languages: English

Open Access Policy:

Type of publications:

Publication frecuency: -

Categories: Electrical and Electronic Engineering (Q2) Safety, Risk, Reliability and Quality (Q2) Electronic, Optical and Magnetic Materials (Q3)

Price

- €

Inmediate OA

NPD

Embargoed OA

- €

Non OA

Metrics

IEEE Transactions on Device and Materials Reliability

0,436

SJR Impact factor

79

H Index

85

Total Docs (Last Year)

240

Total Docs (3 years)

2050

Total Refs

601

Total Cites (3 years)

228

Citable Docs (3 years)

2.68

Cites/Doc (2 years)

24.12

Ref/Doc

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