Default: Journal of Applied Crystallography

ISSN: 0021-8898

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Journal of Applied Crystallography Q1 Unclaimed

International Union of Crystallography United Kingdom
Unfortunately this journal has not been claimed yet. For this reason, some information may be unavailable.

Journal of Applied Crystallography is a journal indexed in SJR in Biochemistry, Genetics and Molecular Biology (miscellaneous) with an H index of 162. It has a price of 2750 €. It has an SJR impact factor of 1,429 and it has a best quartile of Q1. It is published in English. It has an SJR impact factor of 1,429.

Journal of Applied Crystallography focuses its scope in these topics and keywords: xray, neutron, scattering, smallangle, function, structure, wollaston, technique, solution, echo, ...

Type: Journal

Type of Copyright:

Languages: English

Open Access Policy: Open Choice

Type of publications:

Publication frecuency: -

Price

2750 €

Inmediate OA

NPD

Embargoed OA

0 €

Non OA

Metrics

Journal of Applied Crystallography

1,429

SJR Impact factor

162

H Index

175

Total Docs (Last Year)

561

Total Docs (3 years)

6558

Total Refs

2014

Total Cites (3 years)

552

Citable Docs (3 years)

3,27

Cites/Doc (2 years)

37,47

Ref/Doc

Aims and Scope


xray, neutron, scattering, smallangle, function, structure, wollaston, technique, solution, echo, effect, crystal, data, pair, magnetic, parallax, simple, graphical, diffraction, interface, correction, distribution,



Best articles by citations

The application of cluster analysis in X-ray diffraction phase analysis

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Determination of the cation distribution in Fe2Ni(PO4)2using isotopic substitution and powder neutron diffraction

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SXD -the single-crystal diffractometer at the ISIS spallation neutron source

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Structure determination of diclofenac in a diclofenac-containing chitosan matrix using conventional X-ray powder diffraction data

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VRML general position diagrams of the magnetic subperiodic groups

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Erwin Felix Lewy-Bertaut (1913-2003)

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EQUIV2.0: a program for the analysis of equivalent reflections from single-crystal data collections

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Nano-volume plates with excellent optical properties for fast, inexpensive crystallization screening of membrane proteins

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Lorentz-polarization factor for correction of diffraction-line profiles

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A Hough-like approach to the measurement and detection of symmetry in two- and three-dimensional structures

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On the Estimation of the Termination Effect in Fourier Synthesis in X-ray Structure Analysis

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Determining the C60 molecular arrangement in thin films by means of X-ray diffraction

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Imaging modulated reflections from a semi-crystalline state of profilin:actin crystals

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UMWEG: a program for the calculation and graphical representation of multiple-diffraction patterns

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Simultaneous Rheology and Small-Angle Scattering Experiments on Block Copolymer Gels and Melts in Cubic Phases

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Automatic determination of the morphotropic phase boundary in lead magnesium niobate titanate Pb(Mg1/3Nb2/3)(1-x)TixO3within a single crystal using birefringence imaging

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Hot pressing of germanium monochromator crystals

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Structural transitions of hard-sphere colloids studied by spin-echo small-angle neutron scattering

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Fine-rotation attachment to standard goniometers

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A new method of cleaning X-ray tubes from solid carbonates

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Pieter Maarten de Wolff 1919-1998

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Strain Determination in Epitaxic Films of Materials of Orthorhombic Symmetry by High-Resolution X-ray Diffraction

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Structure Investigations of Molecular Crystals Containing the Ring System Cyclo-tris(2,6-pyridylformamidine) by Means of X-ray Powder Diffraction and Force-Field-Constrained Rietveld Refinement

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The contrast of inclusions compared with that of micropipes in back-reflection synchrotron white-beam topographs of SiC

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