ISSN: 0021-8898

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Journal of Applied Crystallography Q1 Unclaimed

International Union of Crystallography United Kingdom

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Journal of Applied Crystallography is a journal indexed in SJR in Biochemistry, Genetics and Molecular Biology (miscellaneous) with an H index of 182. It has a price of 2750 €. It has an SJR impact factor of 1,561 and it has a best quartile of Q1. It is published in English. It has an SJR impact factor of 1,561.

Journal of Applied Crystallography focuses its scope in these topics and keywords: xray, neutron, scattering, smallangle, function, structure, wollaston, technique, solution, echo, ...

Type: Journal

Type of Copyright:

Languages: English

Open Access Policy: Open Choice

Type of publications:

Publication frecuency: -

Categories: Biochemistry, Genetics and Molecular Biology (miscellaneous) (Q1)

Price

2750 €

Inmediate OA

NPD

Embargoed OA

0 €

Non OA

Metrics

1,561

SJR Impact factor

182

H Index

190

Total Docs (Last Year)

504

Total Docs (3 years)

7265

Total Refs

2986

Total Cites (3 years)

495

Citable Docs (3 years)

5.53

Cites/Doc (2 years)

38.24

Ref/Doc

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Aims and Scope

Best articles by citations

The application of cluster analysis in X-ray diffraction phase analysis

Determination of the cation distribution in Fe2Ni(PO4)2using isotopic substitution and powder neutron diffraction

SXD -the single-crystal diffractometer at the ISIS spallation neutron source

Structure determination of diclofenac in a diclofenac-containing chitosan matrix using conventional X-ray powder diffraction data

VRML general position diagrams of the magnetic subperiodic groups

Erwin Felix Lewy-Bertaut (1913-2003)

EQUIV2.0: a program for the analysis of equivalent reflections from single-crystal data collections

Nano-volume plates with excellent optical properties for fast, inexpensive crystallization screening of membrane proteins

Lorentz-polarization factor for correction of diffraction-line profiles

A Hough-like approach to the measurement and detection of symmetry in two- and three-dimensional structures

On the Estimation of the Termination Effect in Fourier Synthesis in X-ray Structure Analysis

Determining the C60 molecular arrangement in thin films by means of X-ray diffraction

SHOW MORE ARTICLES

Imaging modulated reflections from a semi-crystalline state of profilin:actin crystals

UMWEG: a program for the calculation and graphical representation of multiple-diffraction patterns

Simultaneous Rheology and Small-Angle Scattering Experiments on Block Copolymer Gels and Melts in Cubic Phases

Automatic determination of the morphotropic phase boundary in lead magnesium niobate titanate Pb(Mg1/3Nb2/3)(1-x)TixO3within a single crystal using birefringence imaging

Hot pressing of germanium monochromator crystals

Structural transitions of hard-sphere colloids studied by spin-echo small-angle neutron scattering

Fine-rotation attachment to standard goniometers

A new method of cleaning X-ray tubes from solid carbonates

Pieter Maarten de Wolff 1919-1998

Strain Determination in Epitaxic Films of Materials of Orthorhombic Symmetry by High-Resolution X-ray Diffraction

Structure Investigations of Molecular Crystals Containing the Ring System Cyclo-tris(2,6-pyridylformamidine) by Means of X-ray Powder Diffraction and Force-Field-Constrained Rietveld Refinement

The contrast of inclusions compared with that of micropipes in back-reflection synchrotron white-beam topographs of SiC