Default: Journal of Applied Crystallography

ISSN: 0021-8898

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Journal of Applied Crystallography Q1 Unclaimed

International Union of Crystallography United Kingdom
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Journal of Applied Crystallography is a journal indexed in SJR in Biochemistry, Genetics and Molecular Biology (miscellaneous) with an H index of 176. It has a price of 2750 €. It has an SJR impact factor of 1,326 and it has a best quartile of Q1. It is published in English. It has an SJR impact factor of 1,326.

Journal of Applied Crystallography focuses its scope in these topics and keywords: xray, neutron, smallangle, scattering, structure, function, data, simple, interface, parallax, ...

Type: Journal

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Languages: English

Open Access Policy: Open Choice

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Publication frecuency: -


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Journal of Applied Crystallography


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Aims and Scope

xray, neutron, smallangle, scattering, structure, function, data, simple, interface, parallax, magnetic, echo, correction, distribution, diffraction, crystal, pair, solution, graphical, technique, wollaston, effect,

Best articles by citations

The application of cluster analysis in X-ray diffraction phase analysis

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Determination of the cation distribution in Fe2Ni(PO4)2using isotopic substitution and powder neutron diffraction

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SXD -the single-crystal diffractometer at the ISIS spallation neutron source

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Structure determination of diclofenac in a diclofenac-containing chitosan matrix using conventional X-ray powder diffraction data

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VRML general position diagrams of the magnetic subperiodic groups

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Erwin Felix Lewy-Bertaut (1913-2003)

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EQUIV2.0: a program for the analysis of equivalent reflections from single-crystal data collections

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Nano-volume plates with excellent optical properties for fast, inexpensive crystallization screening of membrane proteins

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Lorentz-polarization factor for correction of diffraction-line profiles

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A Hough-like approach to the measurement and detection of symmetry in two- and three-dimensional structures

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On the Estimation of the Termination Effect in Fourier Synthesis in X-ray Structure Analysis

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Determining the C60 molecular arrangement in thin films by means of X-ray diffraction

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Imaging modulated reflections from a semi-crystalline state of profilin:actin crystals

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UMWEG: a program for the calculation and graphical representation of multiple-diffraction patterns

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Simultaneous Rheology and Small-Angle Scattering Experiments on Block Copolymer Gels and Melts in Cubic Phases

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Automatic determination of the morphotropic phase boundary in lead magnesium niobate titanate Pb(Mg1/3Nb2/3)(1-x)TixO3within a single crystal using birefringence imaging

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Hot pressing of germanium monochromator crystals

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Structural transitions of hard-sphere colloids studied by spin-echo small-angle neutron scattering

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Fine-rotation attachment to standard goniometers

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A new method of cleaning X-ray tubes from solid carbonates

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Pieter Maarten de Wolff 1919-1998

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Strain Determination in Epitaxic Films of Materials of Orthorhombic Symmetry by High-Resolution X-ray Diffraction

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Structure Investigations of Molecular Crystals Containing the Ring System Cyclo-tris(2,6-pyridylformamidine) by Means of X-ray Powder Diffraction and Force-Field-Constrained Rietveld Refinement

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The contrast of inclusions compared with that of micropipes in back-reflection synchrotron white-beam topographs of SiC

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