verified SJR 0,475 · Q2 • database Scopus / SJR & Web of Science indexed

United States · Springer New York

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Journal of Electronic Materials

Editor’s Choice: Awarded to fewer than 5% of articles published in the journal each year, Editor’s Choice articles are free to read! Review the journal’s full list of Editor’s Choice articles here. The Journal of Electronic Materials is a peer-reviewed scientific journal of The M...

ISSN: 0361-5235

Publisher: Springer New York

Category: Electronic, Optical and Magnetic Materials

Indexation: verifiedScopus / SJR verifiedWeb of Science

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schedule CountryOfPapers database fields

SJR Impact Factor trending_up

0,475 Q2

H-index 117

Acceptance rate pie_chart

24% Selective

Source Acceptance_Rate

Time to publication hourglass_top

NPD

Field NPD

Publication cost (APC) payments

2.290 € Subscription

Non-OA path 0 €

Metrics

Scimago and CountryOfPapers database fields

Scopus / SJR Web of Science

SJR Impact

0,475

H-index

117

Docs (year)

744

Docs 3y

2214

Total refs

33065

Cites 3y

5954

Citable 3y

2208

Cites/Doc 2y

2.78

Ref/Doc

44.44

Immediate OA

2290 €

Embargoed OA

NPD

Non OA / Submission

0 €

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Best articles by citations

Application of Graphene Oxide-MnFe2O4 Magnetic Nanohybrids as Magnetically Separable Adsorbent for Highly Efficient Removal of Arsenic from Water

Ultrafine SnO2 Nanoparticles Encapsulated in High-Conductivity Graphited Carbon Nanotubes As Anodes for High Electrochemistry Performance Lithium-Ion Batteries

Effect of Ionization Characteristics on Electrochemical Migration Lifetimes of Sn-3.0Ag-0.5Cu Solder in NaCl and Na2SO4 Solutions

Dielectric and Energy Storage Properties of Ba0.65Sr0.35TiO3 Ceramics Modified by BiNbO4

DFT Investigation on the Electronic and Water Adsorption Properties of Pristine and N-Doped TiO2 Nanotubes

CuIn(Se,S)2 Thin Films Synthesis and Characterization from a Single-Bath Electrodeposition Method

Correction to: Solution-Processed Insulators for Flexible Metal-Insulator-Metal Structures

Controlled beam dry etching of InP by using Br2-N2 Gas

Calculation of the Thermoelectric Properties of n- and p-Type Lead Telluride Using a Three-Band Model of the Electron Energy Spectrum

Associated Aspects on Structure, Morphology and Photoluminescence of MgAl2O4:x% Gd3+ Nanophosphor Prepared via Citrate Sol-Gel Method

Assessment of Solder Joint Fatigue Life Under Realistic Service Conditions

Assessment of low-cycle fatigue life of Sn-3.5mass%Ag-X (X=Bi or Cu) alloy by strain range partitioning approach

SHOW MORE ARTICLES

Application of the Transverse Thermoelectric Effects

A New Measurement System to Determine Material Properties of Polishing Pads

Anti-phase domain-free growth of GaAs on offcut (001) Ge wafers by molecular beam epitaxy with suppressed Ge outdiffusion

Annealing Effect on the Structural, Optical and EPR Properties of UV Radiation Emitting Gd3+ Doped SrAl2O4 Host

Annealed AuGe based Ohmic contacts on InP with ion milling prior to metallization

An Electron Paramagnetic Resonance and Photoluminescence Investigation of UVB Radiation Emitting Gadolinium-Activated CaY2Al4SiO12 Garnet Compound

Ag Localized Surface Plasma-Modulated NBE Emissions from ZnCdO Thin Films

Accelerated Metastable Solid-liquid Interdiffusion Bonding

A Study on Sputtered Bi-Te Thermoelectric Films with Various Compositions: Microstructure Evolution and the Effects on Thermoelectric and Electrical Properties

A study of parasitic reactions between NH3 and TMGa or TMAI

A Review of Atomic Scale Characterization Techniques of Molybdenum Disulfide (MoS2)

A Probabilistic Approach to Predict Thermal Fatigue Life for Ball Grid Array Solder Joints

FAQs

Journal of Electronic Materials has an SJR of 0,475 (best quartile Q2) in the CountryOfPapers database.

Immediate OA APC is 2290 EUR. Non-OA / submission fee is 0 EUR.

The acceptance rate recorded for Journal of Electronic Materials is 24%.

Journal of Electronic Materials

Metrics

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Researcher reviews

Best articles by citations

FAQs

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