Journal of Electronic Packaging, Transactions of the ASME
Journal of Electronic Packaging, Transactions of the ASME is a journal indexed in SJR in Electronic, Optical and Magnetic Materials and Electrical and Electronic Engineering with an H index of 65. It has an SJR impact factor of 0,524 and it has a best quartile of Q2. It is published in English. It has an SJR impact factor of 0,524.
Metrics
Scimago and CountryOfPapers database fields
SJR Impact
0,524
H-index
65
Docs (year)
59
Docs 3y
178
Total refs
2012
Cites 3y
511
Citable 3y
173
Cites/Doc 2y
2.85
Ref/Doc
34.1
Immediate OA
—
Embargoed OA
NPD
Non OA / Submission
—
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Best articles by citations
Analytical Thermo-Mechanical Model for Non-Underfilled Area Array Flip Chip Assemblies
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View moreConjugate Heat Transfer From a Two-Layer Substrate Model of a Convectively Cooled Circuit Board
View moreComputational Modeling and Validation of the Encapsulation of Plastic Packages by Transfer Molding
View moreComparison of First-Order Shear and Plane Strain Assumptions in Warpage Prediction of Simply Supported Printed Wiring Boards
View moreCompact Modeling of Fluid Flow and Heat Transfer in Pin Fin Heat Sinks
View moreCoatings Technology Handbook, Second Edition
View moreCharacterization of Lead-Free Solders in Flip Chip Joints
View moreBirefringence Reducing Precision Replication Process Assisted by Infrared Radiation
View moreBehavior of Lead-Free Solder Under Thermomechanical Loading
View moreApplications of a Decomposed Analysis Procedure for Area-Array Packages
View moreA Board Level Study of an Array of Ball Grid Components - Aerodynamic and Thermal Measurements
View moreAnalysis of the Micro-Mechanical Properties in Aged Lead-Free, Fine Pitch Flip Chip Joints
View moreAn Analytical Model for Time-Dependent Shearing Deformation in Area-Array Interconnects
View moreA Viscoplastic Constitutive Model for 63Sn37Pb Eutectic Solders
View moreA Vapotron Effect Application for Electronic Equipment Cooling
View moreA Study on Warpage of Flexible SS Substrates for Large Area MCM-D Packaging
View moreA Study of Process-Induced Residual Stress in PBGA Packages
View moreA Simple Technique for Maximizing the Fundamental Frequency of Vibrating Structures
View moreA New Creep Constitutive Model for Eutectic Solder Alloy
View moreA Nested Finite Element Methodology (NFEM) for Stress Analysis of Electronic Products - Part II: Durability Analysis of Flip Chip and Chip Scale Interconnects
View moreA Nested Finite Element Methodology (NFEM) for Stress Analysis of Electronic Products - Part I: Theory and Formulation
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