Microelectronics Reliability

Characterization of high-density current stressed IGBTs and simulation with an adapted SPICE sub-circuit

A comparison of early stage hot carrier degradation behaviour in 5 and 3 V sub-micron low doped drain metal oxide semiconductor field effect transistors

Characterisation of emitter/base leakage currents in SiGe HBTs produced using selective epitaxy

Breakdown and latent damage of ultra-thin gate oxides under ESD stress conditions

Body effect induced wear-out acceleration in ultra-thin oxides

Analysis of the gate capacitance measurement technique and its application for the evaluation of hot-carrier degradation in submicrometer MOSFETs

An in-line process monitoring method using electron beam induced substrate current

An assessment of the value of added screening of electronic components for commercial aerospace applications

An anti-snapback circuit technique for inhibiting parasitic bipolar conduction during EOS/ESD events

A new lifetime prediction method for hot-carrier degradation in n-MOSFETs with ultrathin gate oxides under Vg=Vd

A new empirical extrapolation method for time-dependent dielectric breakdown reliability projections of thin SiO2 and nitride-oxide dielectrics

A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradation